Research output: Contribution to Journal/Magazine › Journal article
Research output: Contribution to Journal/Magazine › Journal article
}
TY - JOUR
T1 - Fault simulation and modelling of microelectromechanical systems.
AU - Rosing, R.
AU - Lechner, A.
AU - Richardson, A. M. D.
AU - Dorey, A. P.
N1 - ©2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
PY - 2000
Y1 - 2000
N2 - High-reliability and safety-critical markets for microelectromechanical systems are driving new proposals for the integration of efficient built-in test and monitoring functions. The realisation of this technology will require support tools and validation methodologies including fault simulation and testability analysis and full closed-loop simulation techniques to ensure cost and quality targets. This article proposes methods to extend the capabilities of mixed signal and analogue integrated circuit fault simulation techniques to MEMS by including failure mode and effect analysis data and using behavioural modelling techniques compatible with electrical simulators.
AB - High-reliability and safety-critical markets for microelectromechanical systems are driving new proposals for the integration of efficient built-in test and monitoring functions. The realisation of this technology will require support tools and validation methodologies including fault simulation and testability analysis and full closed-loop simulation techniques to ensure cost and quality targets. This article proposes methods to extend the capabilities of mixed signal and analogue integrated circuit fault simulation techniques to MEMS by including failure mode and effect analysis data and using behavioural modelling techniques compatible with electrical simulators.
M3 - Journal article
VL - 11
SP - 242
EP - 250
JO - IEE Journal on Computing and Control Engineering
JF - IEE Journal on Computing and Control Engineering
IS - 5
ER -