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Fault simulation for MEMS

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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Fault simulation for MEMS. / Rosing, R.; Richardson, A.; Dorey, A. et al.
Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. 1999. p. 7/1 -7/6.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Rosing, R, Richardson, A, Dorey, A & Peyton, A 1999, Fault simulation for MEMS. in Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. pp. 7/1 -7/6. https://doi.org/10.1049/ic:19990767

APA

Rosing, R., Richardson, A., Dorey, A., & Peyton, A. (1999). Fault simulation for MEMS. In Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on (pp. 7/1 -7/6) https://doi.org/10.1049/ic:19990767

Vancouver

Rosing R, Richardson A, Dorey A, Peyton A. Fault simulation for MEMS. In Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. 1999. p. 7/1 -7/6 doi: 10.1049/ic:19990767

Author

Rosing, R. ; Richardson, A. ; Dorey, A. et al. / Fault simulation for MEMS. Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. 1999. pp. 7/1 -7/6

Bibtex

@inproceedings{fa97de10dc814b2c8fdc4e03718bee50,
title = "Fault simulation for MEMS",
abstract = "Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process. This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market",
keywords = "BIST, MEMS, behavioural modelling, failure mode analysis, fault modelling, fault simulation, integrated test technology, lumped modelling, mechatronic interfaces, test support, testability analysis, micromechanical devices",
author = "R. Rosing and A. Richardson and A. Dorey and A. Peyton",
year = "1999",
month = jun,
day = "1",
doi = "10.1049/ic:19990767",
language = "Undefined/Unknown",
pages = "7/1 --7/6",
booktitle = "Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on",

}

RIS

TY - GEN

T1 - Fault simulation for MEMS

AU - Rosing, R.

AU - Richardson, A.

AU - Dorey, A.

AU - Peyton, A.

PY - 1999/6/1

Y1 - 1999/6/1

N2 - Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process. This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market

AB - Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process. This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market

KW - BIST

KW - MEMS

KW - behavioural modelling

KW - failure mode analysis

KW - fault modelling

KW - fault simulation

KW - integrated test technology

KW - lumped modelling

KW - mechatronic interfaces

KW - test support

KW - testability analysis

KW - micromechanical devices

U2 - 10.1049/ic:19990767

DO - 10.1049/ic:19990767

M3 - Conference contribution/Paper

SP - 7/1 -7/6

BT - Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on

ER -