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Flexible embedded test solution for high-speed analogue front-end architectures.

Research output: Contribution to journalJournal article

Published

Journal publication date2004
JournalIEE Proceedings - Circuits, Devices and Systems
Journal number4
Volume151
Number of pages11
Pages359-369
Original languageEnglish

Abstract

A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.

Bibliographic note

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