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Flexible embedded test solution for high-speed analogue front-end architectures.

Research output: Contribution to journalJournal article

<mark>Journal publication date</mark>2004
<mark>Journal</mark>IEE Proceedings - Circuits, Devices and Systems
Issue number4
Number of pages11
Pages (from-to)359-369
<mark>Original language</mark>English


A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.

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