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Generation of component level fault models for MEMS.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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Standard

Generation of component level fault models for MEMS. / Rosing, R.; Reichenbach, R.; Richardson, Andrew M. D. et al.
Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). 2001. p. 40-45.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Rosing, R, Reichenbach, R, Richardson, AMD & Dorey, AP 2001, Generation of component level fault models for MEMS. in Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). pp. 40-45.

APA

Rosing, R., Reichenbach, R., Richardson, A. M. D., & Dorey, A. P. (2001). Generation of component level fault models for MEMS. In Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01) (pp. 40-45)

Vancouver

Rosing R, Reichenbach R, Richardson AMD, Dorey AP. Generation of component level fault models for MEMS. In Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). 2001. p. 40-45

Author

Rosing, R. ; Reichenbach, R. ; Richardson, Andrew M. D. et al. / Generation of component level fault models for MEMS. Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). 2001. pp. 40-45

Bibtex

@inbook{03f2b7bab30440c7900e7aece73dfa18,
title = "Generation of component level fault models for MEMS.",
author = "R. Rosing and R. Reichenbach and Richardson, {Andrew M. D.} and Dorey, {A. P.}",
year = "2001",
language = "English",
pages = "40--45",
booktitle = "Proceedings of the 7th international mixed-signal testing workshop (IMSTW {\textquoteright}01)",

}

RIS

TY - CHAP

T1 - Generation of component level fault models for MEMS.

AU - Rosing, R.

AU - Reichenbach, R.

AU - Richardson, Andrew M. D.

AU - Dorey, A. P.

PY - 2001

Y1 - 2001

M3 - Chapter

SP - 40

EP - 45

BT - Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01)

ER -