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School of Engineering

Associated organisational unit

Engineering of Microwaves, Terahertz and Light (E-MIT)

Links

http://www.springerlink.com/content/w03p8076105r4928/

Text available via DOI:

https://doi.org/10.1007/s10836-007-5057-8
Final published version

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Guest Editorial

Research output: Contribution to Journal/Magazine › Editorial › peer-review

Published

Marcelo Lubaszewski (Editor)
Andrew Richardson (Editor)
C. C. Su (Editor)

<mark>Journal publication date</mark>	12/2007
<mark>Journal</mark>	Journal of Electronic Testing
Issue number	6
Volume	23
Number of pages	1
Pages (from-to)	469-469
Publication Status	Published
<mark>Original language</mark>	English