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Guest Editorial

Research output: Contribution to Journal/Magazine › Editorial › peer-review

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Guest Editorial. / Lubaszewski, Marcelo (Editor); Richardson, Andrew (Editor); Su, C. C. (Editor).
In: Journal of Electronic Testing, Vol. 23, No. 6, 12.2007, p. 469-469.

Research output: Contribution to Journal/Magazine › Editorial › peer-review

Harvard

Lubaszewski, M, Richardson, A & Su, CC (eds) 2007, 'Guest Editorial', Journal of Electronic Testing, vol. 23, no. 6, pp. 469-469. https://doi.org/10.1007/s10836-007-5057-8

APA

Lubaszewski, M., Richardson, A., & Su, C. C. (Eds.) (2007). Guest Editorial. Journal of Electronic Testing, 23(6), 469-469. https://doi.org/10.1007/s10836-007-5057-8

Vancouver

Lubaszewski M, (ed.), Richardson A, (ed.), Su CC, (ed.). Guest Editorial. Journal of Electronic Testing. 2007 Dec;23(6):469-469. doi: 10.1007/s10836-007-5057-8

Author

Lubaszewski, Marcelo (Editor) ; Richardson, Andrew (Editor) ; Su, C. C. (Editor). / Guest Editorial. In: Journal of Electronic Testing. 2007 ; Vol. 23, No. 6. pp. 469-469.

Bibtex

@article{0b8c3f17f4a14154ade8bc54ceeb76d3,
title = "Guest Editorial",
author = "Marcelo Lubaszewski and Andrew Richardson and Su, {C. C.}",
year = "2007",
month = dec,
doi = "10.1007/s10836-007-5057-8",
language = "English",
volume = "23",
pages = "469--469",
journal = "Journal of Electronic Testing",
issn = "0923-8174",
publisher = "Springer Netherlands",
number = "6",

}

RIS

TY - JOUR

T1 - Guest Editorial

A2 - Lubaszewski, Marcelo

A2 - Richardson, Andrew

A2 - Su, C. C.

PY - 2007/12

Y1 - 2007/12

U2 - 10.1007/s10836-007-5057-8

DO - 10.1007/s10836-007-5057-8

M3 - Editorial

VL - 23

SP - 469

EP - 469

JO - Journal of Electronic Testing

JF - Journal of Electronic Testing

SN - 0923-8174

IS - 6

ER -