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Guest editorial.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Guest editorial. / Richardson, Andrew M. D.; Mir, S.; Cheng, T.
In: Journal of Electronic Testing, Vol. 22, No. 4-6, 12.2006, p. 311.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Richardson, AMD, Mir, S & Cheng, T 2006, 'Guest editorial.', Journal of Electronic Testing, vol. 22, no. 4-6, pp. 311. <http://www.springerlink.com/content/k74022754h87/?p=32f16573e7fa41a4b6a632390f7a8b9a&pi=6>

APA

Richardson, A. M. D., Mir, S., & Cheng, T. (2006). Guest editorial. Journal of Electronic Testing, 22(4-6), 311. http://www.springerlink.com/content/k74022754h87/?p=32f16573e7fa41a4b6a632390f7a8b9a&pi=6

Vancouver

Richardson AMD, Mir S, Cheng T. Guest editorial. Journal of Electronic Testing. 2006 Dec;22(4-6):311.

Author

Richardson, Andrew M. D. ; Mir, S. ; Cheng, T. / Guest editorial. In: Journal of Electronic Testing. 2006 ; Vol. 22, No. 4-6. pp. 311.

Bibtex

@article{700c7c67b3df4e2f9f5e490c18fbaa4e,
title = "Guest editorial.",
author = "Richardson, {Andrew M. D.} and S. Mir and T. Cheng",
year = "2006",
month = dec,
language = "English",
volume = "22",
pages = "311",
journal = "Journal of Electronic Testing",
issn = "0923-8174",
publisher = "Springer Netherlands",
number = "4-6",

}

RIS

TY - JOUR

T1 - Guest editorial.

AU - Richardson, Andrew M. D.

AU - Mir, S.

AU - Cheng, T.

PY - 2006/12

Y1 - 2006/12

M3 - Journal article

VL - 22

SP - 311

JO - Journal of Electronic Testing

JF - Journal of Electronic Testing

SN - 0923-8174

IS - 4-6

ER -