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High throughput mechanical property testing of materials libraries using capacitance

Research output: Patent

Published

  • Damian Hajduk (Inventor)
  • Eric Carlson (Inventor)
  • Christopher Freitag (Inventor)
  • Oleg Kolosov (Inventor)
  • James Engstrom (Inventor)
  • Adam Safir (Inventor)
  • Ravi Shrinivasan (Inventor)
  • L Matsiev (Inventor)
Publication date12/08/2004
Patent numberUS 2004/0155668 A1
IPCGO1R 27/26
Original languageEnglish

Abstract

One aspect of the present invention provides instruments for measuring mechanical properties of a combinatorial library of materials. The instruments include at least one capacitor to which a member of a library of material samples is removably secured for testing; at least one voltage source for delivering one or more forces to each library member; and at least one sensing device for monitoring the response each library member to the one or more forces. Another aspect of the present invention provides methods of screening a combinatorial library of materials where the method monitors the responses of a plurality of samples on a substrate to a force induced by a capacitor.

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