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High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric

Research output: Patent

Published
  • Christopher Freitag (Inventor)
  • Oleg Kolosov (Inventor)
  • James Engstrom (Inventor)
  • Adam Safir (Inventor)
  • Ravi Shrinivasan (Inventor)
  • L Matsiev (Inventor)
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Patent numberWO 03/019150 A1
IPCGOIN 3/10,3/36
<mark>Original language</mark>English

Abstract

A method for high throughput mechanical property testing of materials libraries. A suitable system, such as an o automated system 100, is provided. A plurality of samples on a substrate are monito red for their response to a force directed by a Force Application source (FAS) 18, where the force applied is selected from thegroup consisting of a fluid, a voltage, a piezoelectric, and a combination thereof.