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High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric

Research output: Patent

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High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric. / Freitag, Christopher (Inventor); Kolosov, Oleg (Inventor); Engstrom, James (Inventor) et al.
Patent No.: WO 03/019150 A1. Mar 06, 2003.

Research output: Patent

Harvard

Freitag, C, Kolosov, O, Engstrom, J, Safir, A, Shrinivasan, R & Matsiev, L Mar. 06 2003, High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric, Patent No. WO 03/019150 A1. <http://www.patentstorm.us/patents/6772642.html>

APA

Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R., & Matsiev, L. (2003). High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric. (Patent No. WO 03/019150 A1). http://www.patentstorm.us/patents/6772642.html

Vancouver

Freitag C, Kolosov O, Engstrom J, Safir A, Shrinivasan R, Matsiev L, inventors. High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric. WO 03/019150 A1. 2003 Mar 6.

Author

Freitag, Christopher (Inventor) ; Kolosov, Oleg (Inventor) ; Engstrom, James (Inventor) et al. / High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric. Patent No.: WO 03/019150 A1. Mar 06, 2003.

Bibtex

@misc{5768f965b5154596b23c32b228fe6ca5,
title = "High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric",
abstract = "A method for high throughput mechanical property testing of materials libraries. A suitable system, such as an o automated system 100, is provided. A plurality of samples on a substrate are monito red for their response to a force directed by a Force Application source (FAS) 18, where the force applied is selected from thegroup consisting of a fluid, a voltage, a piezoelectric, and a combination thereof.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Christopher Freitag and Oleg Kolosov and James Engstrom and Adam Safir and Ravi Shrinivasan and L Matsiev",
year = "2003",
month = mar,
day = "6",
language = "English",
type = "Patent",
note = "WO 03/019150 A1; GOIN 3/10,3/36",

}

RIS

TY - PAT

T1 - High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric

AU - Freitag, Christopher

AU - Kolosov, Oleg

AU - Engstrom, James

AU - Safir, Adam

AU - Shrinivasan, Ravi

AU - Matsiev, L

PY - 2003/3/6

Y1 - 2003/3/6

N2 - A method for high throughput mechanical property testing of materials libraries. A suitable system, such as an o automated system 100, is provided. A plurality of samples on a substrate are monito red for their response to a force directed by a Force Application source (FAS) 18, where the force applied is selected from thegroup consisting of a fluid, a voltage, a piezoelectric, and a combination thereof.

AB - A method for high throughput mechanical property testing of materials libraries. A suitable system, such as an o automated system 100, is provided. A plurality of samples on a substrate are monito red for their response to a force directed by a Force Application source (FAS) 18, where the force applied is selected from thegroup consisting of a fluid, a voltage, a piezoelectric, and a combination thereof.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - WO 03/019150 A1

ER -