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High throughput preparation and analysis of plastically shaped material samples

Research output: Patent

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Patent numberUS7,013,709 B2
IPCB05D 1/40; B29C 31/00
<mark>Original language</mark>English

Abstract

A rapid throughput method for the preparation, analysis or
both of libraries of material samples is provided. According to the method, a plurality of samples is provided. The plurality of samples is then formed into a plurality of films. Thereafter, the plurality of films is plastically deformed. Preferably, the plurality of films is deformed into a configuration appropriate for testing of properties or characteristics of the samples.

Bibliographic note

Full Patent US 7,013,709 B2, Mar.21,2006