A rapid throughput method for the preparation, analysis or
both of libraries of material samples is provided. According to the method, a plurality of samples is provided. The plurality of samples is then formed into a plurality of films. Thereafter, the plurality of films is plastically deformed. Preferably, the plurality of films is deformed into a configuration appropriate for testing of properties or characteristics of the samples.
Full Patent US 7,013,709 B2, Mar.21,2006