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  • Patent front page

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High throughput preparation and analysis of plastically shaped material samples

Research output: Patent

Published

Standard

High throughput preparation and analysis of plastically shaped material samples. / Hajduk, Damian (Inventor); Kolosov, Oleg (Inventor).
Patent No.: US7,013,709 B2. Jul 31, 2003.

Research output: Patent

Harvard

Hajduk, D & Kolosov, O Jul. 31 2003, High throughput preparation and analysis of plastically shaped material samples, Patent No. US7,013,709 B2. <http://www.google.com/patents/US20030141613>

APA

Hajduk, D., & Kolosov, O. (2003). High throughput preparation and analysis of plastically shaped material samples. (Patent No. US7,013,709 B2). http://www.google.com/patents/US20030141613

Vancouver

Hajduk D, Kolosov O, inventors. High throughput preparation and analysis of plastically shaped material samples. US7,013,709 B2. 2003 Jul 31.

Author

Hajduk, Damian (Inventor) ; Kolosov, Oleg (Inventor). / High throughput preparation and analysis of plastically shaped material samples. Patent No.: US7,013,709 B2. Jul 31, 2003.

Bibtex

@misc{b8dc97ed59e74231af45d3d54beee6a7,
title = "High throughput preparation and analysis of plastically shaped material samples",
abstract = "A rapid throughput method for the preparation, analysis orboth of libraries of material samples is provided. According to the method, a plurality of samples is provided. The plurality of samples is then formed into a plurality of films. Thereafter, the plurality of films is plastically deformed. Preferably, the plurality of films is deformed into a configuration appropriate for testing of properties or characteristics of the samples.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Damian Hajduk and Oleg Kolosov",
note = "Full Patent US 7,013,709 B2, Mar.21,2006; US7,013,709 B2; B05D 1/40; B29C 31/00",
year = "2003",
month = jul,
day = "31",
language = "English",
type = "Patent",

}

RIS

TY - PAT

T1 - High throughput preparation and analysis of plastically shaped material samples

AU - Hajduk, Damian

AU - Kolosov, Oleg

N1 - Full Patent US 7,013,709 B2, Mar.21,2006

PY - 2003/7/31

Y1 - 2003/7/31

N2 - A rapid throughput method for the preparation, analysis orboth of libraries of material samples is provided. According to the method, a plurality of samples is provided. The plurality of samples is then formed into a plurality of films. Thereafter, the plurality of films is plastically deformed. Preferably, the plurality of films is deformed into a configuration appropriate for testing of properties or characteristics of the samples.

AB - A rapid throughput method for the preparation, analysis orboth of libraries of material samples is provided. According to the method, a plurality of samples is provided. The plurality of samples is then formed into a plurality of films. Thereafter, the plurality of films is plastically deformed. Preferably, the plurality of films is deformed into a configuration appropriate for testing of properties or characteristics of the samples.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - US7,013,709 B2

ER -