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  • wavelet_charge_sensing_2015

    Rights statement: This is an author-created, un-copyedited version of an article accepted for publication/published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi:10.1088/0957-4484/26/21/215201. © 2015 IOP Publishing

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Identifying single electron charge sensor events using wavelet edge detection

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Published

Standard

Identifying single electron charge sensor events using wavelet edge detection. / Prance, Jonathan; Van Bael, B. J.; Simmons, C. B. et al.
In: Nanotechnology, Vol. 26, No. 21, 215201, 01.05.2015.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Prance, J, Van Bael, BJ, Simmons, CB, Savage, DE, Lagally, MG, Friesen, M, Coppersmith, SN & Eriksson, MA 2015, 'Identifying single electron charge sensor events using wavelet edge detection', Nanotechnology, vol. 26, no. 21, 215201. https://doi.org/10.1088/0957-4484/26/21/215201

APA

Prance, J., Van Bael, B. J., Simmons, C. B., Savage, D. E., Lagally, M. G., Friesen, M., Coppersmith, S. N., & Eriksson, M. A. (2015). Identifying single electron charge sensor events using wavelet edge detection. Nanotechnology, 26(21), Article 215201. https://doi.org/10.1088/0957-4484/26/21/215201

Vancouver

Prance J, Van Bael BJ, Simmons CB, Savage DE, Lagally MG, Friesen M et al. Identifying single electron charge sensor events using wavelet edge detection. Nanotechnology. 2015 May 1;26(21):215201. doi: 10.1088/0957-4484/26/21/215201

Author

Prance, Jonathan ; Van Bael, B. J. ; Simmons, C. B. et al. / Identifying single electron charge sensor events using wavelet edge detection. In: Nanotechnology. 2015 ; Vol. 26, No. 21.

Bibtex

@article{ade511d474864fd5aeb5f4f0a7eafe76,
title = "Identifying single electron charge sensor events using wavelet edge detection",
abstract = "The operation of solid-state qubits often relies on single-shot readout using a nanoelectronic charge sensor, and the detection of events in a noisy sensor signal is crucial for high fidelity readout of such qubits. The most common detection scheme, comparing the signal to a threshold value, is accurate at low noise levels but is not robust to low-frequency noise and signal drift. We describe an alternative method for identifying charge sensor events using wavelet edge detection. The technique is convenient to use and we show that, with realistic signals and a single tunable parameter, wavelet detection can outperform thresholding and is significantly more tolerant to 1/f and low-frequency noise.",
author = "Jonathan Prance and {Van Bael}, {B. J.} and Simmons, {C. B.} and Savage, {D. E.} and Lagally, {M. G.} and Mark Friesen and Coppersmith, {S. N.} and Eriksson, {M. A.}",
note = "This is an author-created, un-copyedited version of an article accepted for publication/published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi:10.1088/0957-4484/26/21/215201. {\textcopyright} 2015 IOP Publishing",
year = "2015",
month = may,
day = "1",
doi = "10.1088/0957-4484/26/21/215201",
language = "English",
volume = "26",
journal = "Nanotechnology",
issn = "0957-4484",
publisher = "IOP Publishing Ltd.",
number = "21",

}

RIS

TY - JOUR

T1 - Identifying single electron charge sensor events using wavelet edge detection

AU - Prance, Jonathan

AU - Van Bael, B. J.

AU - Simmons, C. B.

AU - Savage, D. E.

AU - Lagally, M. G.

AU - Friesen, Mark

AU - Coppersmith, S. N.

AU - Eriksson, M. A.

N1 - This is an author-created, un-copyedited version of an article accepted for publication/published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi:10.1088/0957-4484/26/21/215201. © 2015 IOP Publishing

PY - 2015/5/1

Y1 - 2015/5/1

N2 - The operation of solid-state qubits often relies on single-shot readout using a nanoelectronic charge sensor, and the detection of events in a noisy sensor signal is crucial for high fidelity readout of such qubits. The most common detection scheme, comparing the signal to a threshold value, is accurate at low noise levels but is not robust to low-frequency noise and signal drift. We describe an alternative method for identifying charge sensor events using wavelet edge detection. The technique is convenient to use and we show that, with realistic signals and a single tunable parameter, wavelet detection can outperform thresholding and is significantly more tolerant to 1/f and low-frequency noise.

AB - The operation of solid-state qubits often relies on single-shot readout using a nanoelectronic charge sensor, and the detection of events in a noisy sensor signal is crucial for high fidelity readout of such qubits. The most common detection scheme, comparing the signal to a threshold value, is accurate at low noise levels but is not robust to low-frequency noise and signal drift. We describe an alternative method for identifying charge sensor events using wavelet edge detection. The technique is convenient to use and we show that, with realistic signals and a single tunable parameter, wavelet detection can outperform thresholding and is significantly more tolerant to 1/f and low-frequency noise.

U2 - 10.1088/0957-4484/26/21/215201

DO - 10.1088/0957-4484/26/21/215201

M3 - Journal article

VL - 26

JO - Nanotechnology

JF - Nanotechnology

SN - 0957-4484

IS - 21

M1 - 215201

ER -