Home > Research > Publications & Outputs > Influence of charge carriers on corrugation of ...

Electronic data

  • 1-s2.0-S0038109817303587-main

    Rights statement: This is the author’s version of a work that was accepted for publication in Solid State Communications. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Solid State Communications, 270, 2018 DOI: 10.1016/j.ssc.2017.11.003

    Accepted author manuscript, 1.02 MB, PDF document

    Available under license: CC BY-NC-ND: Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License

Links

Text available via DOI:

View graph of relations

Influence of charge carriers on corrugation of suspended graphene

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Published
Close
<mark>Journal publication date</mark>02/2018
<mark>Journal</mark>Solid State Communications
Volume270
Number of pages5
Pages (from-to)1-5
Publication StatusPublished
Early online date10/11/17
<mark>Original language</mark>English

Abstract

Electronic degrees of freedom are predicted to play a significant role in mechanics of two-dimensional crystalline membranes. Here we show that appearance of charge carriers may cause a considerable impact on suspended graphene corrugation, thus leading to additional mechanism resulting in charge carriers mobility variation with their density. This finding may account for some details of suspended graphene conductivity dependence on its doping level and suggests that proper modeling of suspended graphene-based device properties must include the influence of charge carriers on its surface corrugation.

Bibliographic note

This is the author’s version of a work that was accepted for publication in Solid State Communications. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Solid State Communications, 270, 2018 DOI: 10.1016/j.ssc.2017.11.003