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Integrated circuitry for controlling analysis of a fluid

Research output: Patent

Published

Standard

Integrated circuitry for controlling analysis of a fluid. / Kolosov, Oleg (Inventor); Matsiev, L (Inventor); Spitkovsky, Mikhail (Inventor) et al.
Patent No.: US7158897B2. Sept 22, 2005.

Research output: Patent

Harvard

Kolosov, O, Matsiev, L, Spitkovsky, M & Gammer, V Sept. 22 2005, Integrated circuitry for controlling analysis of a fluid, Patent No. US7158897B2. <http://www.google.com/patents/US7158897>

APA

Kolosov, O., Matsiev, L., Spitkovsky, M., & Gammer, V. (2005). Integrated circuitry for controlling analysis of a fluid. (Patent No. US7158897B2). http://www.google.com/patents/US7158897

Vancouver

Kolosov O, Matsiev L, Spitkovsky M, Gammer V, inventors. Integrated circuitry for controlling analysis of a fluid. US7158897B2. 2005 Sept 22.

Author

Kolosov, Oleg (Inventor) ; Matsiev, L (Inventor) ; Spitkovsky, Mikhail (Inventor) et al. / Integrated circuitry for controlling analysis of a fluid. Patent No.: US7158897B2. Sept 22, 2005.

Bibtex

@misc{6faed68228534c9d9f7303430c25bda3,
title = "Integrated circuitry for controlling analysis of a fluid",
abstract = "Circuitry for processing signals used to determining characteristics of a fluid under-test is provided. The circuitry includes a compensation device and integrated circuitry for interfacing with a tuning fork that is capable of being in contact with the fluid under-test and the compensation device. The compensation device is configured to differentially process a signal output of the tuning fork, and thedifferential processing of the compensation device is actively controlled by the integrated circuitry so as to produce a processed signal. The processed signal defines the characteristics of the fluid under-test, and the compensationdevice includes capacitive matching circuitry. Also provided are systems that incorporate the circuitry.",
keywords = "network analysis, ASIC, on-chip lick-in amplifier, fluid analysis, impedance monitoring, frequency sweep",
author = "Oleg Kolosov and L Matsiev and Mikhail Spitkovsky and Vladimir Gammer",
year = "2005",
month = sep,
day = "22",
language = "English",
type = "Patent",
note = "US7158897B2; GO1N 31/00 (2006.01); GO1N 11/00 (2006.01); GO1L 7/00 (2006.01)",

}

RIS

TY - PAT

T1 - Integrated circuitry for controlling analysis of a fluid

AU - Kolosov, Oleg

AU - Matsiev, L

AU - Spitkovsky, Mikhail

AU - Gammer, Vladimir

PY - 2005/9/22

Y1 - 2005/9/22

N2 - Circuitry for processing signals used to determining characteristics of a fluid under-test is provided. The circuitry includes a compensation device and integrated circuitry for interfacing with a tuning fork that is capable of being in contact with the fluid under-test and the compensation device. The compensation device is configured to differentially process a signal output of the tuning fork, and thedifferential processing of the compensation device is actively controlled by the integrated circuitry so as to produce a processed signal. The processed signal defines the characteristics of the fluid under-test, and the compensationdevice includes capacitive matching circuitry. Also provided are systems that incorporate the circuitry.

AB - Circuitry for processing signals used to determining characteristics of a fluid under-test is provided. The circuitry includes a compensation device and integrated circuitry for interfacing with a tuning fork that is capable of being in contact with the fluid under-test and the compensation device. The compensation device is configured to differentially process a signal output of the tuning fork, and thedifferential processing of the compensation device is actively controlled by the integrated circuitry so as to produce a processed signal. The processed signal defines the characteristics of the fluid under-test, and the compensationdevice includes capacitive matching circuitry. Also provided are systems that incorporate the circuitry.

KW - network analysis

KW - ASIC

KW - on-chip lick-in amplifier

KW - fluid analysis

KW - impedance monitoring

KW - frequency sweep

M3 - Patent

M1 - US7158897B2

ER -