Standard
Harvard
Richardson, A, Vermeiren, W, Straube, B & Olbrich, T 1996, '
Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS)', Paper presented at 5th International Conference on Micro-, Electro-, Opto-, Mechanical Systems and Components, Postdam, Germany,
17/09/96 -
19/09/96 pp. 273.
APA
Richardson, A., Vermeiren, W., Straube, B., & Olbrich, T. (1996).
Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS). 273. Paper presented at 5th International Conference on Micro-, Electro-, Opto-, Mechanical Systems and Components, Postdam, Germany.
Vancouver
Author
Bibtex
@conference{6695a1e2bdb2406b84bd64206f96e180,
title = "Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS)",
author = "Andrew Richardson and W Vermeiren and B Straube and Thomas Olbrich",
year = "1996",
month = sep,
day = "19",
language = "English",
pages = "273",
note = "5th International Conference on Micro-, Electro-, Opto-, Mechanical Systems and Components, ; Conference date: 17-09-1996 Through 19-09-1996",
}
RIS
TY - CONF
T1 - Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS)
AU - Richardson, Andrew
AU - Vermeiren, W
AU - Straube, B
AU - Olbrich, Thomas
PY - 1996/9/19
Y1 - 1996/9/19
M3 - Conference paper
SP - 273
T2 - 5th International Conference on Micro-, Electro-, Opto-, Mechanical Systems and Components,
Y2 - 17 September 1996 through 19 September 1996
ER -