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Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks. / Chekanov, A. S. ; Low, T. S. ; Alli, S. et al.
In: IEEE Transactions on Magnetics, Vol. 32, No. 5, 09.1996, p. 3696-3698.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Chekanov, AS, Low, TS, Alli, S, Kolosov, O & Briggs, A 1996, 'Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks', IEEE Transactions on Magnetics, vol. 32, no. 5, pp. 3696-3698. https://doi.org/10.1109/20.538807

APA

Chekanov, A. S., Low, T. S., Alli, S., Kolosov, O., & Briggs, A. (1996). Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks. IEEE Transactions on Magnetics, 32(5), 3696-3698. https://doi.org/10.1109/20.538807

Vancouver

Chekanov AS, Low TS, Alli S, Kolosov O, Briggs A. Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks. IEEE Transactions on Magnetics. 1996 Sept;32(5):3696-3698. doi: 10.1109/20.538807

Author

Chekanov, A. S. ; Low, T. S. ; Alli, S. et al. / Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks. In: IEEE Transactions on Magnetics. 1996 ; Vol. 32, No. 5. pp. 3696-3698.

Bibtex

@article{f892659bb9f04551961bc09cf8c33e66,
title = "Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks",
abstract = "Two different types of microcracks in thin film head alumina were observed : cracks initiated at the alumina edges growing toward the head pole tips and cracks initiated at the head pole tip area and growing towards the leading edge of the alumina. Thermally induced cracks may cause degradation of magnetic head read/write performance due to the damage of the pole tip gap or corrosion of the head pole tips. Data from Ultrasonic AFM (UFM) indicate the difference in the subsurface structure of the observed cracks of the alumina.",
author = "Chekanov, {A. S.} and Low, {T. S.} and S. Alli and Oleg Kolosov and Andrew Briggs",
year = "1996",
month = sep,
doi = "10.1109/20.538807",
language = "English",
volume = "32",
pages = "3696--3698",
journal = "IEEE Transactions on Magnetics",
issn = "0018-9464",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",

}

RIS

TY - JOUR

T1 - Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks

AU - Chekanov, A. S.

AU - Low, T. S.

AU - Alli, S.

AU - Kolosov, Oleg

AU - Briggs, Andrew

PY - 1996/9

Y1 - 1996/9

N2 - Two different types of microcracks in thin film head alumina were observed : cracks initiated at the alumina edges growing toward the head pole tips and cracks initiated at the head pole tip area and growing towards the leading edge of the alumina. Thermally induced cracks may cause degradation of magnetic head read/write performance due to the damage of the pole tip gap or corrosion of the head pole tips. Data from Ultrasonic AFM (UFM) indicate the difference in the subsurface structure of the observed cracks of the alumina.

AB - Two different types of microcracks in thin film head alumina were observed : cracks initiated at the alumina edges growing toward the head pole tips and cracks initiated at the head pole tip area and growing towards the leading edge of the alumina. Thermally induced cracks may cause degradation of magnetic head read/write performance due to the damage of the pole tip gap or corrosion of the head pole tips. Data from Ultrasonic AFM (UFM) indicate the difference in the subsurface structure of the observed cracks of the alumina.

U2 - 10.1109/20.538807

DO - 10.1109/20.538807

M3 - Journal article

VL - 32

SP - 3696

EP - 3698

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 5

ER -