Rights statement: Copyright 2004 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. http://dx.doi.org/10.1117/12.547414
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Research output: Contribution to Journal/Magazine › Journal article
Research output: Contribution to Journal/Magazine › Journal article
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TY - JOUR
T1 - Modeling and controlling of stochastic dynamics of complex nonlinear systems
AU - Luchinsky, Dmitry G.
AU - McClintock, Peter V. E.
AU - Silchenko, Alexandr N.
AU - Smelyanskiy, Vadim N.
AU - Dykman, Mark
N1 - Copyright 2004 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. http://dx.doi.org/10.1117/12.547414
PY - 2004
Y1 - 2004
N2 - An application of the path-integral approach to an analysis of the fluctuations in complex dynamical systems is discussed. It is shown that essentially the same ideas underly recent progress in the solutions of a number of long-standing problems in complex dynamics. In particular, we consider the problems of prediction, control and inference of chaotic dynamics perturbed by noise in the framework of path-integral approach.
AB - An application of the path-integral approach to an analysis of the fluctuations in complex dynamical systems is discussed. It is shown that essentially the same ideas underly recent progress in the solutions of a number of long-standing problems in complex dynamics. In particular, we consider the problems of prediction, control and inference of chaotic dynamics perturbed by noise in the framework of path-integral approach.
U2 - 10.1117/12.547414
DO - 10.1117/12.547414
M3 - Journal article
VL - 5471
SP - 145
EP - 158
JO - Proceedings of SPIE
JF - Proceedings of SPIE
SN - 0277-786X
ER -