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Mutation testing for aspect-oriented programs

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Mutation testing for aspect-oriented programs. / Ferrari, Fabiano; Maldonado, José; Rashid, Awais.
Software Testing, Verification, and Validation, 2008 1st International Conference on . IEEE Publishing, 2008. p. 52-61.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

Harvard

Ferrari, F, Maldonado, J & Rashid, A 2008, Mutation testing for aspect-oriented programs. in Software Testing, Verification, and Validation, 2008 1st International Conference on . IEEE Publishing, pp. 52-61, First International Conference on Software Testing, Verification, and Validation, ICST 2008, Lillehammer, Norway, 9/04/08. https://doi.org/10.1109/ICST.2008.37

APA

Ferrari, F., Maldonado, J., & Rashid, A. (2008). Mutation testing for aspect-oriented programs. In Software Testing, Verification, and Validation, 2008 1st International Conference on (pp. 52-61). IEEE Publishing. https://doi.org/10.1109/ICST.2008.37

Vancouver

Ferrari F, Maldonado J, Rashid A. Mutation testing for aspect-oriented programs. In Software Testing, Verification, and Validation, 2008 1st International Conference on . IEEE Publishing. 2008. p. 52-61 doi: 10.1109/ICST.2008.37

Author

Ferrari, Fabiano ; Maldonado, José ; Rashid, Awais. / Mutation testing for aspect-oriented programs. Software Testing, Verification, and Validation, 2008 1st International Conference on . IEEE Publishing, 2008. pp. 52-61

Bibtex

@inproceedings{32086ed76af94bbe8d20d3799c0f2fff,
title = "Mutation testing for aspect-oriented programs",
abstract = "Mutation testing has been shown to be one of the strongest testing criteria for the evaluation of both programs and test suites. Comprehensive sets of mutants require strong test sets to achieve acceptable testing coverage. Moreover, mutation operators are valuable for the evaluation of other testing approaches. Although its importance has been highlighted for aspect-oriented (AO) programs, there is still a need for a suitable set of mutation operators for AO languages. The quality of the mutation testing itself relies on the quality of such operators. This paper presents the design of a set of mutation operators for AspectJ-based programs. These operators model instances of fault types identified in an extensive survey. The fault types and respective operators are grouped according to the related language features. We also discuss the generalisation of the fault types to AO approaches other than AspectJ and the coverage that may be achieved with the application of the proposed operators. In addition, a cost analysis based on two case studies involving real-world applications has provided us feedback on the most expensive operators, which will support the definition of further testing strategies.",
keywords = "AO fault types , Aspect-Oriented testing , Mutation testing , mutation operators",
author = "Fabiano Ferrari and Jos{\'e} Maldonado and Awais Rashid",
year = "2008",
doi = "10.1109/ICST.2008.37",
language = "English",
isbn = "978-0-7695-3127-4 ",
pages = "52--61",
booktitle = "Software Testing, Verification, and Validation, 2008 1st International Conference on",
publisher = "IEEE Publishing",
note = "First International Conference on Software Testing, Verification, and Validation, ICST 2008 ; Conference date: 09-04-2008 Through 11-04-2008",

}

RIS

TY - GEN

T1 - Mutation testing for aspect-oriented programs

AU - Ferrari, Fabiano

AU - Maldonado, José

AU - Rashid, Awais

PY - 2008

Y1 - 2008

N2 - Mutation testing has been shown to be one of the strongest testing criteria for the evaluation of both programs and test suites. Comprehensive sets of mutants require strong test sets to achieve acceptable testing coverage. Moreover, mutation operators are valuable for the evaluation of other testing approaches. Although its importance has been highlighted for aspect-oriented (AO) programs, there is still a need for a suitable set of mutation operators for AO languages. The quality of the mutation testing itself relies on the quality of such operators. This paper presents the design of a set of mutation operators for AspectJ-based programs. These operators model instances of fault types identified in an extensive survey. The fault types and respective operators are grouped according to the related language features. We also discuss the generalisation of the fault types to AO approaches other than AspectJ and the coverage that may be achieved with the application of the proposed operators. In addition, a cost analysis based on two case studies involving real-world applications has provided us feedback on the most expensive operators, which will support the definition of further testing strategies.

AB - Mutation testing has been shown to be one of the strongest testing criteria for the evaluation of both programs and test suites. Comprehensive sets of mutants require strong test sets to achieve acceptable testing coverage. Moreover, mutation operators are valuable for the evaluation of other testing approaches. Although its importance has been highlighted for aspect-oriented (AO) programs, there is still a need for a suitable set of mutation operators for AO languages. The quality of the mutation testing itself relies on the quality of such operators. This paper presents the design of a set of mutation operators for AspectJ-based programs. These operators model instances of fault types identified in an extensive survey. The fault types and respective operators are grouped according to the related language features. We also discuss the generalisation of the fault types to AO approaches other than AspectJ and the coverage that may be achieved with the application of the proposed operators. In addition, a cost analysis based on two case studies involving real-world applications has provided us feedback on the most expensive operators, which will support the definition of further testing strategies.

KW - AO fault types

KW - Aspect-Oriented testing

KW - Mutation testing

KW - mutation operators

U2 - 10.1109/ICST.2008.37

DO - 10.1109/ICST.2008.37

M3 - Conference contribution/Paper

SN - 978-0-7695-3127-4

SP - 52

EP - 61

BT - Software Testing, Verification, and Validation, 2008 1st International Conference on

PB - IEEE Publishing

T2 - First International Conference on Software Testing, Verification, and Validation, ICST 2008

Y2 - 9 April 2008 through 11 April 2008

ER -