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Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope. / Kolosov, Oleg; Yamanaka, K .
In: Japanese Journal of Applied Physics, Vol. 32, No. 8A, 01.08.1993, p. L1095-L1098.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Kolosov, O & Yamanaka, K 1993, 'Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope', Japanese Journal of Applied Physics, vol. 32, no. 8A, pp. L1095-L1098. https://doi.org/10.1143/JJAP.32.L1095

APA

Kolosov, O., & Yamanaka, K. (1993). Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope. Japanese Journal of Applied Physics, 32(8A), L1095-L1098. https://doi.org/10.1143/JJAP.32.L1095

Vancouver

Kolosov O, Yamanaka K. Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope. Japanese Journal of Applied Physics. 1993 Aug 1;32(8A):L1095-L1098. doi: 10.1143/JJAP.32.L1095

Author

Kolosov, Oleg ; Yamanaka, K . / Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope. In: Japanese Journal of Applied Physics. 1993 ; Vol. 32, No. 8A. pp. L1095-L1098.

Bibtex

@article{7f8999525a3541c4b260c1132e9488c5,
title = "Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope",
abstract = "A new method is proposed to detect ultrasonic vibration of the samples in the Atomic Force Microscope (AFM) using nonlinearity in the tip-sample interaction force curve F(z). Small amplitude ultrasonic vibration less than 0.2 nm is detected as an average displacement of a cantilever. This Ultrasonic Force Mode (UFM) of operation is advantageous in detecting ultrasonic vibration with frequencies up to the GHz range, using an AFM cantilever with a resonant frequency below 100 kHz. It was found that a strong repulsive force is acting after an ultrasonic amplitude threshold of the is crossed, with the amplitude of this threshold depending upon the average force applied to the tip.",
author = "Oleg Kolosov and K Yamanaka",
year = "1993",
month = aug,
day = "1",
doi = "10.1143/JJAP.32.L1095",
language = "English",
volume = "32",
pages = "L1095--L1098",
journal = "Japanese Journal of Applied Physics",
issn = "0021-4922",
publisher = "Institute of Physics Publishing",
number = "8A",

}

RIS

TY - JOUR

T1 - Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope

AU - Kolosov, Oleg

AU - Yamanaka, K

PY - 1993/8/1

Y1 - 1993/8/1

N2 - A new method is proposed to detect ultrasonic vibration of the samples in the Atomic Force Microscope (AFM) using nonlinearity in the tip-sample interaction force curve F(z). Small amplitude ultrasonic vibration less than 0.2 nm is detected as an average displacement of a cantilever. This Ultrasonic Force Mode (UFM) of operation is advantageous in detecting ultrasonic vibration with frequencies up to the GHz range, using an AFM cantilever with a resonant frequency below 100 kHz. It was found that a strong repulsive force is acting after an ultrasonic amplitude threshold of the is crossed, with the amplitude of this threshold depending upon the average force applied to the tip.

AB - A new method is proposed to detect ultrasonic vibration of the samples in the Atomic Force Microscope (AFM) using nonlinearity in the tip-sample interaction force curve F(z). Small amplitude ultrasonic vibration less than 0.2 nm is detected as an average displacement of a cantilever. This Ultrasonic Force Mode (UFM) of operation is advantageous in detecting ultrasonic vibration with frequencies up to the GHz range, using an AFM cantilever with a resonant frequency below 100 kHz. It was found that a strong repulsive force is acting after an ultrasonic amplitude threshold of the is crossed, with the amplitude of this threshold depending upon the average force applied to the tip.

U2 - 10.1143/JJAP.32.L1095

DO - 10.1143/JJAP.32.L1095

M3 - Journal article

VL - 32

SP - L1095-L1098

JO - Japanese Journal of Applied Physics

JF - Japanese Journal of Applied Physics

SN - 0021-4922

IS - 8A

ER -