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On the Analysis and Improvement of Yield for TWT Small-Signal Gain

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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On the Analysis and Improvement of Yield for TWT Small-Signal Gain. / Paoloni, Claudio.
In: IEEE Transactions on Electron Devices, Vol. 55, No. 10, 10.2008, p. 2774-2778.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Paoloni, C 2008, 'On the Analysis and Improvement of Yield for TWT Small-Signal Gain', IEEE Transactions on Electron Devices, vol. 55, no. 10, pp. 2774-2778. https://doi.org/10.1109/TED.2008.2003083

APA

Paoloni, C. (2008). On the Analysis and Improvement of Yield for TWT Small-Signal Gain. IEEE Transactions on Electron Devices, 55(10), 2774-2778. https://doi.org/10.1109/TED.2008.2003083

Vancouver

Paoloni C. On the Analysis and Improvement of Yield for TWT Small-Signal Gain. IEEE Transactions on Electron Devices. 2008 Oct;55(10):2774-2778. doi: 10.1109/TED.2008.2003083

Author

Paoloni, Claudio. / On the Analysis and Improvement of Yield for TWT Small-Signal Gain. In: IEEE Transactions on Electron Devices. 2008 ; Vol. 55, No. 10. pp. 2774-2778.

Bibtex

@article{1c8ee52e44eb4bdf8857a0e9f040e5f5,
title = "On the Analysis and Improvement of Yield for TWT Small-Signal Gain",
abstract = "Traveling-wave tube (TWT) performance is sensibly affected by fabrication tolerances. An accurate yield evaluation and comprehension of the factors that contribute to yield degradation is fundamental to avoid excess costs in the fabrication process. In this paper, a procedure to evaluate and improve the yield of multisection helix TWTs in the design phase will be proposed, assuming a small-signal gain performance goal as the design target. An extended set of fabrication parameters is considered to provide a reliable estimate of the manufacturing tolerance effect on the final result. The introduction of yield sensitivity histograms together with cathode voltage adjustment demonstrates a relevant TWT yield improvement, together with indications on which fabrication step requires higher accuracy.",
keywords = "Slow-wave structure, statistical analysis , tolerance , traveling-wave tube (TWT) , yield",
author = "Claudio Paoloni",
year = "2008",
month = oct,
doi = "10.1109/TED.2008.2003083",
language = "English",
volume = "55",
pages = "2774--2778",
journal = "IEEE Transactions on Electron Devices",
issn = "0018-9383",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "10",

}

RIS

TY - JOUR

T1 - On the Analysis and Improvement of Yield for TWT Small-Signal Gain

AU - Paoloni, Claudio

PY - 2008/10

Y1 - 2008/10

N2 - Traveling-wave tube (TWT) performance is sensibly affected by fabrication tolerances. An accurate yield evaluation and comprehension of the factors that contribute to yield degradation is fundamental to avoid excess costs in the fabrication process. In this paper, a procedure to evaluate and improve the yield of multisection helix TWTs in the design phase will be proposed, assuming a small-signal gain performance goal as the design target. An extended set of fabrication parameters is considered to provide a reliable estimate of the manufacturing tolerance effect on the final result. The introduction of yield sensitivity histograms together with cathode voltage adjustment demonstrates a relevant TWT yield improvement, together with indications on which fabrication step requires higher accuracy.

AB - Traveling-wave tube (TWT) performance is sensibly affected by fabrication tolerances. An accurate yield evaluation and comprehension of the factors that contribute to yield degradation is fundamental to avoid excess costs in the fabrication process. In this paper, a procedure to evaluate and improve the yield of multisection helix TWTs in the design phase will be proposed, assuming a small-signal gain performance goal as the design target. An extended set of fabrication parameters is considered to provide a reliable estimate of the manufacturing tolerance effect on the final result. The introduction of yield sensitivity histograms together with cathode voltage adjustment demonstrates a relevant TWT yield improvement, together with indications on which fabrication step requires higher accuracy.

KW - Slow-wave structure

KW - statistical analysis

KW - tolerance

KW - traveling-wave tube (TWT)

KW - yield

U2 - 10.1109/TED.2008.2003083

DO - 10.1109/TED.2008.2003083

M3 - Journal article

VL - 55

SP - 2774

EP - 2778

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

SN - 0018-9383

IS - 10

ER -