Research output: Contribution to conference - Without ISBN/ISSN › Conference paper
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper
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TY - CONF
T1 - Optimal algorithms for wavelet-based denoising in PD measurement.
AU - Zhou, C.
AU - Ma, X.
AU - Kemp, I. J.
PY - 2003/8
Y1 - 2003/8
N2 - Recent research showed that the Wavelet-based approach is superior to the methods based in only time-domain or frequency-domain for PD measurement denoising, and that Wavelet Transform(WT) can potentially be used to extract PD pulses from strong noises irrespective of the form of noise present. However, the method is more complex than the Fourier Transform(FT), and it needs prior knowledge and experience to be applied to produce its best effect. The present paper presents the optimal algorithms which can be used to select the best wavelet to be used, the determination of the number of levels that should be analysed in the denoising process, and the algorithm for determination of the threshold values. Results show that with the proposed set of algorithms, automatic use of the WT for PD measurement denoising can be implemented without prior knowledge of the noises present.
AB - Recent research showed that the Wavelet-based approach is superior to the methods based in only time-domain or frequency-domain for PD measurement denoising, and that Wavelet Transform(WT) can potentially be used to extract PD pulses from strong noises irrespective of the form of noise present. However, the method is more complex than the Fourier Transform(FT), and it needs prior knowledge and experience to be applied to produce its best effect. The present paper presents the optimal algorithms which can be used to select the best wavelet to be used, the determination of the number of levels that should be analysed in the denoising process, and the algorithm for determination of the threshold values. Results show that with the proposed set of algorithms, automatic use of the WT for PD measurement denoising can be implemented without prior knowledge of the noises present.
M3 - Conference paper
T2 - IEEE International Symposium on High Voltage Engineering
Y2 - 23 August 2003 through 25 August 2003
ER -