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Probability models for sequential-stage system reliability growth via failure mode removal

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Published

Standard

Probability models for sequential-stage system reliability growth via failure mode removal. / Glazebrook, K D; Gaver, D P; Jacobs, P A et al.
In: International Journal of Reliability, Quality and Safety Engineering, Vol. 10, 2003, p. 15-40.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Glazebrook, KD, Gaver, DP, Jacobs, PA & Seaglie, EA 2003, 'Probability models for sequential-stage system reliability growth via failure mode removal', International Journal of Reliability, Quality and Safety Engineering, vol. 10, pp. 15-40.

APA

Glazebrook, K. D., Gaver, D. P., Jacobs, P. A., & Seaglie, E. A. (2003). Probability models for sequential-stage system reliability growth via failure mode removal. International Journal of Reliability, Quality and Safety Engineering, 10, 15-40.

Vancouver

Glazebrook KD, Gaver DP, Jacobs PA, Seaglie EA. Probability models for sequential-stage system reliability growth via failure mode removal. International Journal of Reliability, Quality and Safety Engineering. 2003;10:15-40.

Author

Glazebrook, K D ; Gaver, D P ; Jacobs, P A et al. / Probability models for sequential-stage system reliability growth via failure mode removal. In: International Journal of Reliability, Quality and Safety Engineering. 2003 ; Vol. 10. pp. 15-40.

Bibtex

@article{19c954a6726841738e1ece8e100198f9,
title = "Probability models for sequential-stage system reliability growth via failure mode removal",
author = "Glazebrook, {K D} and Gaver, {D P} and Jacobs, {P A} and Seaglie, {E A}",
year = "2003",
language = "English",
volume = "10",
pages = "15--40",
journal = "International Journal of Reliability, Quality and Safety Engineering",
issn = "0218-5393",
publisher = "World Scientific Publishing Co. Pte Ltd",

}

RIS

TY - JOUR

T1 - Probability models for sequential-stage system reliability growth via failure mode removal

AU - Glazebrook, K D

AU - Gaver, D P

AU - Jacobs, P A

AU - Seaglie, E A

PY - 2003

Y1 - 2003

M3 - Journal article

VL - 10

SP - 15

EP - 40

JO - International Journal of Reliability, Quality and Safety Engineering

JF - International Journal of Reliability, Quality and Safety Engineering

SN - 0218-5393

ER -