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Punctured binary turbo-codes with optimized performance

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

Published

Standard

Punctured binary turbo-codes with optimized performance. / Chatzigeorgiou, I ; Rodrigues, M R D ; Wassell, I J et al.
IEEE 62nd Vehicular Technology Conference (VTC 2005 - Fall). NEW YORK: IEEE, 2005. p. 1965-1969.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

Harvard

Chatzigeorgiou, I, Rodrigues, MRD, Wassell, IJ & Carrasco, R 2005, Punctured binary turbo-codes with optimized performance. in IEEE 62nd Vehicular Technology Conference (VTC 2005 - Fall). IEEE, NEW YORK, pp. 1965-1969. https://doi.org/10.1109/VETECF.2005.1558451

APA

Chatzigeorgiou, I., Rodrigues, M. R. D., Wassell, I. J., & Carrasco, R. (2005). Punctured binary turbo-codes with optimized performance. In IEEE 62nd Vehicular Technology Conference (VTC 2005 - Fall) (pp. 1965-1969). IEEE. https://doi.org/10.1109/VETECF.2005.1558451

Vancouver

Chatzigeorgiou I, Rodrigues MRD, Wassell IJ, Carrasco R. Punctured binary turbo-codes with optimized performance. In IEEE 62nd Vehicular Technology Conference (VTC 2005 - Fall). NEW YORK: IEEE. 2005. p. 1965-1969 doi: 10.1109/VETECF.2005.1558451

Author

Chatzigeorgiou, I ; Rodrigues, M R D ; Wassell, I J et al. / Punctured binary turbo-codes with optimized performance. IEEE 62nd Vehicular Technology Conference (VTC 2005 - Fall). NEW YORK : IEEE, 2005. pp. 1965-1969

Bibtex

@inproceedings{4026b3aec12f4a6889b7c5d1fdbff510,
title = "Punctured binary turbo-codes with optimized performance",
abstract = "Although rate-1/3 turbo codes achieve an outstanding performance in additive white Gaussian noise channels, their performance degrades for higher code rates. In this paper it is illustrated that puncturing both the systematic as well as the parity bits can result in a better performance than puncturing the parity bits only. In addition we suggest an interleaver design rule for punctured partially systematic turbo codes, which can further improve performance, without increasing the encoding and decoding complexity.",
keywords = "turbo codes, punctured codes, interleaving, CONVOLUTIONAL-CODES",
author = "I Chatzigeorgiou and Rodrigues, {M R D} and Wassell, {I J} and R Carrasco",
year = "2005",
doi = "10.1109/VETECF.2005.1558451",
language = "English",
isbn = "0-7803-9152-7",
pages = "1965--1969",
booktitle = "IEEE 62nd Vehicular Technology Conference (VTC 2005 - Fall)",
publisher = "IEEE",

}

RIS

TY - GEN

T1 - Punctured binary turbo-codes with optimized performance

AU - Chatzigeorgiou, I

AU - Rodrigues, M R D

AU - Wassell, I J

AU - Carrasco, R

PY - 2005

Y1 - 2005

N2 - Although rate-1/3 turbo codes achieve an outstanding performance in additive white Gaussian noise channels, their performance degrades for higher code rates. In this paper it is illustrated that puncturing both the systematic as well as the parity bits can result in a better performance than puncturing the parity bits only. In addition we suggest an interleaver design rule for punctured partially systematic turbo codes, which can further improve performance, without increasing the encoding and decoding complexity.

AB - Although rate-1/3 turbo codes achieve an outstanding performance in additive white Gaussian noise channels, their performance degrades for higher code rates. In this paper it is illustrated that puncturing both the systematic as well as the parity bits can result in a better performance than puncturing the parity bits only. In addition we suggest an interleaver design rule for punctured partially systematic turbo codes, which can further improve performance, without increasing the encoding and decoding complexity.

KW - turbo codes

KW - punctured codes

KW - interleaving

KW - CONVOLUTIONAL-CODES

U2 - 10.1109/VETECF.2005.1558451

DO - 10.1109/VETECF.2005.1558451

M3 - Conference contribution/Paper

SN - 0-7803-9152-7

SP - 1965

EP - 1969

BT - IEEE 62nd Vehicular Technology Conference (VTC 2005 - Fall)

PB - IEEE

CY - NEW YORK

ER -