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Quantum Transport Thermometry for Electrons in Graphene

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Quantum Transport Thermometry for Electrons in Graphene. / Kechedzhi, K.; Horsell, D. W.; Tikhonenko, F. V. et al.
In: Physical review letters, Vol. 102, No. 6, 066801, 13.02.2009.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Kechedzhi, K, Horsell, DW, Tikhonenko, FV, Savchenko, AK, Gorbachev, RV, Lerner, IV & Falko, V 2009, 'Quantum Transport Thermometry for Electrons in Graphene', Physical review letters, vol. 102, no. 6, 066801. https://doi.org/10.1103/PhysRevLett.102.066801

APA

Kechedzhi, K., Horsell, D. W., Tikhonenko, F. V., Savchenko, A. K., Gorbachev, R. V., Lerner, I. V., & Falko, V. (2009). Quantum Transport Thermometry for Electrons in Graphene. Physical review letters, 102(6), Article 066801. https://doi.org/10.1103/PhysRevLett.102.066801

Vancouver

Kechedzhi K, Horsell DW, Tikhonenko FV, Savchenko AK, Gorbachev RV, Lerner IV et al. Quantum Transport Thermometry for Electrons in Graphene. Physical review letters. 2009 Feb 13;102(6):066801. doi: 10.1103/PhysRevLett.102.066801

Author

Kechedzhi, K. ; Horsell, D. W. ; Tikhonenko, F. V. et al. / Quantum Transport Thermometry for Electrons in Graphene. In: Physical review letters. 2009 ; Vol. 102, No. 6.

Bibtex

@article{4ddc0ddec7374fae96b2ea56573770d4,
title = "Quantum Transport Thermometry for Electrons in Graphene",
abstract = "We propose a method of measuring the electron temperature T-e in mesoscopic conductors and demonstrate experimentally its applicability to micron-size graphene devices in the linear-response regime (T-e approximate to T, the bath temperature). The method can be especially useful in case of overheating, T-e > T. It is based on analysis of the correlation function of mesoscopic conductance fluctuations. Although the fluctuation amplitude strongly depends on the details of electron scattering in graphene, we show that T-e extracted from the correlation function is insensitive to these details.",
author = "K. Kechedzhi and Horsell, {D. W.} and Tikhonenko, {F. V.} and Savchenko, {A. K.} and Gorbachev, {R. V.} and Lerner, {I. V.} and Vladimir Falko",
note = "{\textcopyright} 2009 The American Physical Society",
year = "2009",
month = feb,
day = "13",
doi = "10.1103/PhysRevLett.102.066801",
language = "English",
volume = "102",
journal = "Physical review letters",
issn = "1079-7114",
publisher = "American Physical Society",
number = "6",

}

RIS

TY - JOUR

T1 - Quantum Transport Thermometry for Electrons in Graphene

AU - Kechedzhi, K.

AU - Horsell, D. W.

AU - Tikhonenko, F. V.

AU - Savchenko, A. K.

AU - Gorbachev, R. V.

AU - Lerner, I. V.

AU - Falko, Vladimir

N1 - © 2009 The American Physical Society

PY - 2009/2/13

Y1 - 2009/2/13

N2 - We propose a method of measuring the electron temperature T-e in mesoscopic conductors and demonstrate experimentally its applicability to micron-size graphene devices in the linear-response regime (T-e approximate to T, the bath temperature). The method can be especially useful in case of overheating, T-e > T. It is based on analysis of the correlation function of mesoscopic conductance fluctuations. Although the fluctuation amplitude strongly depends on the details of electron scattering in graphene, we show that T-e extracted from the correlation function is insensitive to these details.

AB - We propose a method of measuring the electron temperature T-e in mesoscopic conductors and demonstrate experimentally its applicability to micron-size graphene devices in the linear-response regime (T-e approximate to T, the bath temperature). The method can be especially useful in case of overheating, T-e > T. It is based on analysis of the correlation function of mesoscopic conductance fluctuations. Although the fluctuation amplitude strongly depends on the details of electron scattering in graphene, we show that T-e extracted from the correlation function is insensitive to these details.

UR - http://www.scopus.com/inward/record.url?scp=62449324981&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.102.066801

DO - 10.1103/PhysRevLett.102.066801

M3 - Journal article

VL - 102

JO - Physical review letters

JF - Physical review letters

SN - 1079-7114

IS - 6

M1 - 066801

ER -