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Reconfiguration based built-in self-test for analogue front-end circuits

Research output: Contribution to conferenceConference paper

Published

Publication date18/06/1999
Number of pages5
Pages243-247
Original languageEnglish

Conference

Conference5th IEEE International Mixed Signal Testing Workshop
CountryCanada
CityWhistler
Period15/06/9918/06/99

Abstract

Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC). This
paper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test an
AGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions.