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Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
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TY - CONF
T1 - Reconfiguration based built-in self-test for analogue front-end circuits
AU - Richardson, Andrew
AU - Lechner, Andreas
AU - Hermes, B.
PY - 1999/6/18
Y1 - 1999/6/18
N2 - Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC). Thispaper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test anAGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions.
AB - Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC). Thispaper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test anAGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions.
KW - mixed signal test
KW - Design for Testability
M3 - Conference paper
SP - 243
EP - 247
T2 - 5th IEEE International Mixed Signal Testing Workshop
Y2 - 15 June 1999 through 18 June 1999
ER -