Rights statement: This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI. Published by the American Physical Society
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Final published version
Licence: CC BY
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
}
TY - JOUR
T1 - Regular rather than chaotic origin of the resonant transport in superlattices
AU - Soskin, Stanislav M.
AU - Khovanov, I. A.
AU - McClintock, Peter V. E.
N1 - This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI. Published by the American Physical Society
PY - 2015/4/24
Y1 - 2015/4/24
N2 - We address the enhancement of electron transport in semiconductor superlattices that occurs in combined electric and magnetic fields when cyclotron rotation becomes resonant with Bloch oscillations. We show that the phenomenon is regular in origin, contrary to the widespread belief that it arises through chaotic diffusion. The theory verified by simulations provides an accurate description of earlier numerical results and suggests new ways of controlling resonant transport
AB - We address the enhancement of electron transport in semiconductor superlattices that occurs in combined electric and magnetic fields when cyclotron rotation becomes resonant with Bloch oscillations. We show that the phenomenon is regular in origin, contrary to the widespread belief that it arises through chaotic diffusion. The theory verified by simulations provides an accurate description of earlier numerical results and suggests new ways of controlling resonant transport
U2 - 10.1103/PhysRevLett.114.166802
DO - 10.1103/PhysRevLett.114.166802
M3 - Journal article
VL - 114
JO - Physical review letters
JF - Physical review letters
SN - 1079-7114
IS - 16
M1 - 166802
ER -