Rights statement: © 1998 The American Physical Society
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Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
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TY - JOUR
T1 - Remote impurity scattering in modulation-doped GaAs/AlxGa1-xAs heterojunctions
AU - Hayne, M
AU - Usher, Alan
AU - Harris, Jeffrey J
AU - Moshchalkov, Victor V
AU - Foxon, C Thomas
N1 - © 1998 The American Physical Society
PY - 1998/6/15
Y1 - 1998/6/15
N2 - We have investigated the time-dependent mobility and density of a modulation-doped GaAs/AlxGa1-xAs heterojunction subsequent to the lionization of DX centers using the persistent photoconductivity effect. Our results are in excellent agreement with a simple theory of mobility Limited by independent charged scattering centers. We show that these scattering centers are fluctuations in the average impurity potential which principally arise due to the presence of both positively and negatively charged impurities, and that the effect of correlation among charged impurities can be treated in terms of the removal of individual potential fluctuations.
AB - We have investigated the time-dependent mobility and density of a modulation-doped GaAs/AlxGa1-xAs heterojunction subsequent to the lionization of DX centers using the persistent photoconductivity effect. Our results are in excellent agreement with a simple theory of mobility Limited by independent charged scattering centers. We show that these scattering centers are fluctuations in the average impurity potential which principally arise due to the presence of both positively and negatively charged impurities, and that the effect of correlation among charged impurities can be treated in terms of the removal of individual potential fluctuations.
KW - 2-DIMENSIONAL ELECTRON-GAS
KW - MOBILITY
KW - GAAS
KW - ALXGA1-XAS
KW - HETEROSTRUCTURES
U2 - 10.1103/PhysRevB.57.14813
DO - 10.1103/PhysRevB.57.14813
M3 - Journal article
VL - 57
SP - 14813
EP - 14817
JO - Physical review B
JF - Physical review B
SN - 1550-235X
IS - 23
ER -