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Resonances while surmounting a fluctuating barrier.

Research output: Contribution to journalJournal article


<mark>Journal publication date</mark>2000
<mark>Journal</mark>Physical Review E
Issue number2
Number of pages6
Pages (from-to)1170-1175
<mark>Original language</mark>English


Electronic analog experiments on escape over a fluctuating potential barrier are performed for the case when the fluctuations are caused by Ornstein-Uhlenbeck noise (OUN). In its dependence on the relation between the two OUN parameters (the correlation time t and noise strength Q) the nonmonotonic variation of the mean escape time T as a function of t can exhibit either a minimum (resonant activation), or a maximum (inhibition of activation), or both these effects. The possible resonant nature of these features is discussed. We claim that T is not a good quantity to describe the resonancelike character of the problem. Independently of the specific relation between the OUN parameters, the resonance manifests itself as a maximal lowering of the potential barrier during the escape event, and it appears for t of the order of the relaxation time toward the metastable state