Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems

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Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems. / Al-Gayem, Qais; Liu, Hong; Khan, Haroon et al.
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE, 2013. p. 133-138.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Al-Gayem, Q, Liu, H, Khan, H & Richardson, A 2013, Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems. in On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE, pp. 133-138. https://doi.org/10.1109/IOLTS.2013.6604064

APA

Al-Gayem, Q., Liu, H., Khan, H., & Richardson, A. (2013). Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems. In On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International (pp. 133-138). IEEE. https://doi.org/10.1109/IOLTS.2013.6604064

Vancouver

Al-Gayem Q, Liu H, Khan H , Richardson A. Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems. In On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE. 2013. p. 133-138 doi: 10.1109/IOLTS.2013.6604064

Author

Al-Gayem, Qais ; Liu, Hong ; Khan, Haroon et al. / Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems. On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE, 2013. pp. 133-138

Bibtex

@inproceedings{33826a6114944617b3b3f8a09ef26310,

title = "Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems",

abstract = "Lab-on-Chip devices are complex multifunctional heterogeneous microsystems that have the potential to strongly influence advances in important areas such as pharmacology, security, and environmental analysis. High reliability requirements in many of these microsystems are crucial which makes test more challenging especially given the need to validate multiple multi-domain interfaces and realise on-line solutions. Based on fault modeling and impedance analysis of the electrode/electrolyte interface and a customised prototype array structure, this paper proposes a self-test solution that targets degraded sensing microelectrodes within Multi Electrode Array's (MEA). The principle of this approach is to scan the strength of a test signal over the whole array to monitor the defective sensing electrodes. The test solution has been applied at the system level where an analogue multiplexer, an LCD, and a microcontroller have been used to achieve a real time condition monitoring technique.",

keywords = "Bio-fluidic microsystems, Built-in self-test, Microfluidics",

author = "Qais Al-Gayem and Hong Liu and Haroon Khan and Andrew Richardson",

year = "2013",

doi = "10.1109/IOLTS.2013.6604064",

language = "English",

pages = "133--138",

booktitle = "On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International",

publisher = "IEEE",

}

RIS

TY - GEN

T1 - Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems

AU - Al-Gayem, Qais

AU - Liu, Hong

AU - Khan, Haroon

AU - Richardson, Andrew

PY - 2013

Y1 - 2013

N2 - Lab-on-Chip devices are complex multifunctional heterogeneous microsystems that have the potential to strongly influence advances in important areas such as pharmacology, security, and environmental analysis. High reliability requirements in many of these microsystems are crucial which makes test more challenging especially given the need to validate multiple multi-domain interfaces and realise on-line solutions. Based on fault modeling and impedance analysis of the electrode/electrolyte interface and a customised prototype array structure, this paper proposes a self-test solution that targets degraded sensing microelectrodes within Multi Electrode Array's (MEA). The principle of this approach is to scan the strength of a test signal over the whole array to monitor the defective sensing electrodes. The test solution has been applied at the system level where an analogue multiplexer, an LCD, and a microcontroller have been used to achieve a real time condition monitoring technique.

AB - Lab-on-Chip devices are complex multifunctional heterogeneous microsystems that have the potential to strongly influence advances in important areas such as pharmacology, security, and environmental analysis. High reliability requirements in many of these microsystems are crucial which makes test more challenging especially given the need to validate multiple multi-domain interfaces and realise on-line solutions. Based on fault modeling and impedance analysis of the electrode/electrolyte interface and a customised prototype array structure, this paper proposes a self-test solution that targets degraded sensing microelectrodes within Multi Electrode Array's (MEA). The principle of this approach is to scan the strength of a test signal over the whole array to monitor the defective sensing electrodes. The test solution has been applied at the system level where an analogue multiplexer, an LCD, and a microcontroller have been used to achieve a real time condition monitoring technique.

KW - Bio-fluidic microsystems

KW - Built-in self-test

KW - Microfluidics

U2 - 10.1109/IOLTS.2013.6604064

DO - 10.1109/IOLTS.2013.6604064

M3 - Conference contribution/Paper

SP - 133

EP - 138

BT - On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International

PB - IEEE

ER -

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