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Semiparametric approach to the one-way layout

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Semiparametric approach to the one-way layout. / Fokianos, K.; Qin, J.; Kedem, B. et al.
In: Technometrics, Vol. 43, No. 1, 2001, p. 56-65.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Fokianos, K, Qin, J, Kedem, B & Short, DA 2001, 'Semiparametric approach to the one-way layout', Technometrics, vol. 43, no. 1, pp. 56-65. https://doi.org/10.1198/00401700152404327

APA

Fokianos, K., Qin, J., Kedem, B., & Short, D. A. (2001). Semiparametric approach to the one-way layout. Technometrics, 43(1), 56-65. https://doi.org/10.1198/00401700152404327

Vancouver

Fokianos K, Qin J, Kedem B, Short DA. Semiparametric approach to the one-way layout. Technometrics. 2001;43(1):56-65. doi: 10.1198/00401700152404327

Author

Fokianos, K. ; Qin, J. ; Kedem, B. et al. / Semiparametric approach to the one-way layout. In: Technometrics. 2001 ; Vol. 43, No. 1. pp. 56-65.

Bibtex

@article{ce40ec0a284149d4b27777ef382dfc78,
title = "Semiparametric approach to the one-way layout",
keywords = "Case-control data, Empirical likelihood, Exponential tilt, Logistic regression, Reference distribution, Smooth goodness of fit",
author = "K. Fokianos and J. Qin and B. Kedem and D.A. Short",
year = "2001",
doi = "10.1198/00401700152404327",
language = "English",
volume = "43",
pages = "56--65",
journal = "Technometrics",
issn = "0040-1706",
publisher = "American Statistical Association",
number = "1",

}

RIS

TY - JOUR

T1 - Semiparametric approach to the one-way layout

AU - Fokianos, K.

AU - Qin, J.

AU - Kedem, B.

AU - Short, D.A.

PY - 2001

Y1 - 2001

KW - Case-control data

KW - Empirical likelihood

KW - Exponential tilt

KW - Logistic regression

KW - Reference distribution

KW - Smooth goodness of fit

U2 - 10.1198/00401700152404327

DO - 10.1198/00401700152404327

M3 - Journal article

VL - 43

SP - 56

EP - 65

JO - Technometrics

JF - Technometrics

SN - 0040-1706

IS - 1

ER -