Short circuit faults in state-of-the-art ADCs – are they hard or soft? - Research Portal

Short circuit faults in state-of-the-art ADCs – are they hard or soft?

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

Publication date	2001
Host publication	10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan
Publisher	IEEE Computer Society
Pages	417-422
Number of pages	6
ISBN (print)	0769513786 9780769513782
<mark>Original language</mark>	English