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Short circuit faults in state-of-the-art ADCs – are they hard or soft?

Research output: Contribution in Book/Report/ProceedingsChapter

Published
Publication date2001
Host publication10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan
PublisherIEEE Computer Society
Pages417-422
Number of pages6
ISBN (Print)0769513786 9780769513782
<mark>Original language</mark>English