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Short circuit faults in state-of-the-art ADCs – are they hard or soft?

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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Short circuit faults in state-of-the-art ADCs – are they hard or soft? / Lechner, A.; Richardson, Andrew M. D.; Hermes, B.
10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, 2001. p. 417-422.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Lechner, A, Richardson, AMD & Hermes, B 2001, Short circuit faults in state-of-the-art ADCs – are they hard or soft? in 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, pp. 417-422.

APA

Lechner, A., Richardson, A. M. D., & Hermes, B. (2001). Short circuit faults in state-of-the-art ADCs – are they hard or soft? In 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan (pp. 417-422). IEEE Computer Society.

Vancouver

Lechner A, Richardson AMD, Hermes B. Short circuit faults in state-of-the-art ADCs – are they hard or soft? In 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society. 2001. p. 417-422

Author

Lechner, A. ; Richardson, Andrew M. D. ; Hermes, B. / Short circuit faults in state-of-the-art ADCs – are they hard or soft?. 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, 2001. pp. 417-422

Bibtex

@inbook{ef61ed8344d84e3cbe0a515286331b5c,
title = "Short circuit faults in state-of-the-art ADCs – are they hard or soft?",
author = "A. Lechner and Richardson, {Andrew M. D.} and B. Hermes",
year = "2001",
language = "English",
isbn = "0769513786 9780769513782 ",
pages = "417--422",
booktitle = "10th Asian Test Symposium : proceedings",
publisher = "IEEE Computer Society",

}

RIS

TY - CHAP

T1 - Short circuit faults in state-of-the-art ADCs – are they hard or soft?

AU - Lechner, A.

AU - Richardson, Andrew M. D.

AU - Hermes, B.

PY - 2001

Y1 - 2001

M3 - Chapter

SN - 0769513786 9780769513782

SP - 417

EP - 422

BT - 10th Asian Test Symposium : proceedings

PB - IEEE Computer Society

ER -