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  • Study of the Secondary Electron Yield in Dielectrics

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Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models. / Banón-Caballero, David; Socuellamos, Juan; Mata, Rafael et al.
In: IEEE Transactions on Plasma Science, Vol. 46, No. 4, 04.2018, p. 859-867.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Banón-Caballero, D, Socuellamos, J, Mata, R, Mercadé, L, Gimeno, B, Boria, V, Raboso, D, Semenov, V, Rakova, E, Sánchez-Royo, J & Segura, A 2018, 'Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models', IEEE Transactions on Plasma Science, vol. 46, no. 4, pp. 859-867. https://doi.org/10.1109/TPS.2018.2809602

APA

Banón-Caballero, D., Socuellamos, J., Mata, R., Mercadé, L., Gimeno, B., Boria, V., Raboso, D., Semenov, V., Rakova, E., Sánchez-Royo, J., & Segura, A. (2018). Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models. IEEE Transactions on Plasma Science, 46(4), 859-867. https://doi.org/10.1109/TPS.2018.2809602

Vancouver

Banón-Caballero D, Socuellamos J, Mata R, Mercadé L, Gimeno B, Boria V et al. Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models. IEEE Transactions on Plasma Science. 2018 Apr;46(4):859-867. Epub 2018 Mar 8. doi: 10.1109/TPS.2018.2809602

Author

Banón-Caballero, David ; Socuellamos, Juan ; Mata, Rafael et al. / Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models. In: IEEE Transactions on Plasma Science. 2018 ; Vol. 46, No. 4. pp. 859-867.

Bibtex

@article{d51a3b716ae245dcb7d8e99fc9b90d9a,
title = "Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models",
abstract = "Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.",
author = "David Ban{\'o}n-Caballero and Juan Socuellamos and Rafael Mata and Laura Mercad{\'e} and Benito Gimeno and Vicente Boria and David Raboso and Vladimir Semenov and Elena Rakova and Juan S{\'a}nchez-Royo and Alfredo Segura",
note = "{\textcopyright}2018 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.",
year = "2018",
month = apr,
doi = "10.1109/TPS.2018.2809602",
language = "English",
volume = "46",
pages = "859--867",
journal = "IEEE Transactions on Plasma Science",
issn = "0093-3813",
publisher = "IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC",
number = "4",

}

RIS

TY - JOUR

T1 - Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

AU - Banón-Caballero, David

AU - Socuellamos, Juan

AU - Mata, Rafael

AU - Mercadé, Laura

AU - Gimeno, Benito

AU - Boria, Vicente

AU - Raboso, David

AU - Semenov, Vladimir

AU - Rakova, Elena

AU - Sánchez-Royo, Juan

AU - Segura, Alfredo

N1 - ©2018 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

PY - 2018/4

Y1 - 2018/4

N2 - Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

AB - Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

U2 - 10.1109/TPS.2018.2809602

DO - 10.1109/TPS.2018.2809602

M3 - Journal article

VL - 46

SP - 859

EP - 867

JO - IEEE Transactions on Plasma Science

JF - IEEE Transactions on Plasma Science

SN - 0093-3813

IS - 4

ER -