Subsurface imaging of stacking faults and dislocations in WS2 CVD grown flakes via Ultrasonic and Heterodyne Force Microscopy

Associated organisational units

Electronic data

MM_Poster_UK_SPM_2017
Accepted author manuscript, 5.61 MB, PDF document
Available under license: CC BY: Creative Commons Attribution 4.0 International License

Keywords

Nanomechanics, 2D materials, TMD, transition metal dichalcogenides, SPM

View graph of relations

Research output: Contribution to conference - Without ISBN/ISSN › Poster

Published

Standard

Subsurface imaging of stacking faults and dislocations in WS2 CVD grown flakes via Ultrasonic and Heterodyne Force Microscopy. / San Juan Mucientes, Marta; Shearer, Melinda; Hamers, Bob et al.
2017. Poster session presented at Bruker SPM conference and users meeting, Leeds , United Kingdom.

Research output: Contribution to conference - Without ISBN/ISSN › Poster

Bibtex

@conference{7c66947580454204b9657b2457ce0bad,

title = "Subsurface imaging of stacking faults and dislocations in WS2 CVD grown flakes via Ultrasonic and Heterodyne Force Microscopy",

abstract = "The two-dimensional (2D) materials have multiple applications including optoelectronics [1] and fabrication of micro and nanoelectromechanical systems (MEMS and NEMS respectively), in particular, the layered transition metal dichalcogenide tungsten disulphide (WS2) already applied in the aerospace, automotive, and defence industries due to its high robustness. One of the WS2 synthetic methods is the Chemical Vapour Deposition (CVD) growth. By this method, the material is deposited creating complex structures formed by the orientation change of the individual layers of material making screw dislocations [1]. Therefore, analysing the structure under the surface is possible to understand how the spiral structures are stacked.We used SPM nanomechanical techniques combined with ultrasound - the Ultrasonic Force Microscopy (UFM) and the Heterodyne Force Microscopy (HFM) to identify the dislocations and faults between several stacked WS2 layers. The UFM images allowed to identify different areas with different stiffness which in the topographic AFM images do not show any particular features. The HFM images have better contrast when the difference frequency is equal to the contact resonance of the cantilever (54.4kHz).References[1] M.J. Shearer, L. Samad, Y. Zhang, Y. Zhao, A. Puretzky, K.W. Eliceiri, J.C. Wright, R.J. Hamers, S. Jin, Journal of the American Chemical Society, 139 (2017) 3496-3504.[2] F. Dinelli, M.R. Castell, D.A. Ritchie, N.J. Mason, G.A.D. Briggs, O.V. Kolosov, Philosophical Magazine A, Physics of Condensed Matter Structure Defects and Mechanical Properties, 80 (2000) 2299-2323.[3] M.T. Cuberes, H.E. Assender, G.A.D. Briggs, O.V. Kolosov, Journal of Physics D-Applied Physics, 33 (2000) 2347-2355.",

keywords = "Nanomechanics, 2D materials, TMD, transition metal dichalcogenides, SPM",

author = "{San Juan Mucientes}, Marta and Melinda Shearer and Bob Hamers and Yuzhou Zhao and Song Jin and Kolosov, {Oleg Victor}",

year = "2017",

month = oct,

day = "11",

language = "English",

note = "Bruker SPM conference and users meeting ; Conference date: 10-10-2017 Through 11-10-2017",

}

RIS

TY - CONF

T1 - Subsurface imaging of stacking faults and dislocations in WS2 CVD grown flakes via Ultrasonic and Heterodyne Force Microscopy

AU - San Juan Mucientes, Marta

AU - Shearer, Melinda

AU - Hamers, Bob

AU - Zhao, Yuzhou

AU - Jin, Song

AU - Kolosov, Oleg Victor

PY - 2017/10/11

Y1 - 2017/10/11

N2 - The two-dimensional (2D) materials have multiple applications including optoelectronics [1] and fabrication of micro and nanoelectromechanical systems (MEMS and NEMS respectively), in particular, the layered transition metal dichalcogenide tungsten disulphide (WS2) already applied in the aerospace, automotive, and defence industries due to its high robustness. One of the WS2 synthetic methods is the Chemical Vapour Deposition (CVD) growth. By this method, the material is deposited creating complex structures formed by the orientation change of the individual layers of material making screw dislocations [1]. Therefore, analysing the structure under the surface is possible to understand how the spiral structures are stacked.We used SPM nanomechanical techniques combined with ultrasound - the Ultrasonic Force Microscopy (UFM) and the Heterodyne Force Microscopy (HFM) to identify the dislocations and faults between several stacked WS2 layers. The UFM images allowed to identify different areas with different stiffness which in the topographic AFM images do not show any particular features. The HFM images have better contrast when the difference frequency is equal to the contact resonance of the cantilever (54.4kHz).References[1] M.J. Shearer, L. Samad, Y. Zhang, Y. Zhao, A. Puretzky, K.W. Eliceiri, J.C. Wright, R.J. Hamers, S. Jin, Journal of the American Chemical Society, 139 (2017) 3496-3504.[2] F. Dinelli, M.R. Castell, D.A. Ritchie, N.J. Mason, G.A.D. Briggs, O.V. Kolosov, Philosophical Magazine A, Physics of Condensed Matter Structure Defects and Mechanical Properties, 80 (2000) 2299-2323.[3] M.T. Cuberes, H.E. Assender, G.A.D. Briggs, O.V. Kolosov, Journal of Physics D-Applied Physics, 33 (2000) 2347-2355.

AB - The two-dimensional (2D) materials have multiple applications including optoelectronics [1] and fabrication of micro and nanoelectromechanical systems (MEMS and NEMS respectively), in particular, the layered transition metal dichalcogenide tungsten disulphide (WS2) already applied in the aerospace, automotive, and defence industries due to its high robustness. One of the WS2 synthetic methods is the Chemical Vapour Deposition (CVD) growth. By this method, the material is deposited creating complex structures formed by the orientation change of the individual layers of material making screw dislocations [1]. Therefore, analysing the structure under the surface is possible to understand how the spiral structures are stacked.We used SPM nanomechanical techniques combined with ultrasound - the Ultrasonic Force Microscopy (UFM) and the Heterodyne Force Microscopy (HFM) to identify the dislocations and faults between several stacked WS2 layers. The UFM images allowed to identify different areas with different stiffness which in the topographic AFM images do not show any particular features. The HFM images have better contrast when the difference frequency is equal to the contact resonance of the cantilever (54.4kHz).References[1] M.J. Shearer, L. Samad, Y. Zhang, Y. Zhao, A. Puretzky, K.W. Eliceiri, J.C. Wright, R.J. Hamers, S. Jin, Journal of the American Chemical Society, 139 (2017) 3496-3504.[2] F. Dinelli, M.R. Castell, D.A. Ritchie, N.J. Mason, G.A.D. Briggs, O.V. Kolosov, Philosophical Magazine A, Physics of Condensed Matter Structure Defects and Mechanical Properties, 80 (2000) 2299-2323.[3] M.T. Cuberes, H.E. Assender, G.A.D. Briggs, O.V. Kolosov, Journal of Physics D-Applied Physics, 33 (2000) 2347-2355.

KW - Nanomechanics

KW - 2D materials

KW - TMD

KW - transition metal dichalcogenides

KW - SPM

M3 - Poster

T2 - Bruker SPM conference and users meeting

Y2 - 10 October 2017 through 11 October 2017

ER -

Research

Associated organisational units

Electronic data

Keywords