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Supply current monitoring in cmos circuits for reliability prediction and test.

Research output: Contribution to journalJournal article


Associated organisational unit

Journal publication date1992
JournalQuality and Reliability Engineering International
Journal number6
Number of pages6
Original languageEnglish


The monitoring of supply current in CMOS VLSI devices has been suggested as a tool for both detecting reliability hazards and increasing the effectiveness of standard functional testing. This paper reviews these techniques and describes a method used at Lancaster for evaluating the IDDQ test.