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Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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Standard

Test evaluation for complex mixed signal ICs by introducing layout dependent faults. / Harvey, R. J. A.; Richardson, A. M. D.; Bruls, E. M. J. et al.
Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, 1993. p. 6/1-8.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Harvey, RJA, Richardson, AMD, Bruls, EMJ & Baker, K 1993, Test evaluation for complex mixed signal ICs by introducing layout dependent faults. in Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, pp. 6/1-8.

APA

Harvey, R. J. A., Richardson, A. M. D., Bruls, E. M. J., & Baker, K. (1993). Test evaluation for complex mixed signal ICs by introducing layout dependent faults. In Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240 (pp. 6/1-8).

Vancouver

Harvey RJA, Richardson AMD, Bruls EMJ, Baker K. Test evaluation for complex mixed signal ICs by introducing layout dependent faults. In Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London. 1993. p. 6/1-8

Author

Harvey, R. J. A. ; Richardson, A. M. D. ; Bruls, E. M. J. et al. / Test evaluation for complex mixed signal ICs by introducing layout dependent faults. Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, 1993. pp. 6/1-8

Bibtex

@inbook{ae5afc979ce342499d696924a7be4c69,
title = "Test evaluation for complex mixed signal ICs by introducing layout dependent faults.",
author = "Harvey, {R. J. A.} and Richardson, {A. M. D.} and Bruls, {E. M. J.} and K. Baker",
year = "1993",
language = "English",
pages = "6/1--8",
booktitle = "Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240",

}

RIS

TY - CHAP

T1 - Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

AU - Harvey, R. J. A.

AU - Richardson, A. M. D.

AU - Bruls, E. M. J.

AU - Baker, K.

PY - 1993

Y1 - 1993

M3 - Chapter

SP - 6/1-8

BT - Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240

CY - London

ER -