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Test support strategies for MEMS

Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

Published

Standard

Test support strategies for MEMS. / Richardson, Andrew; Rosing, Richard; Peyton, Anthony et al.
1999. 345-350 Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada.

Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

Harvard

Richardson, A, Rosing, R, Peyton, A & Dorey, A 1999, 'Test support strategies for MEMS', Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada, 15/06/99 - 18/06/99 pp. 345-350.

APA

Richardson, A., Rosing, R., Peyton, A., & Dorey, A. (1999). Test support strategies for MEMS. 345-350. Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada.

Vancouver

Richardson A, Rosing R, Peyton A, Dorey A. Test support strategies for MEMS. 1999. Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada.

Author

Richardson, Andrew ; Rosing, Richard ; Peyton, Anthony et al. / Test support strategies for MEMS. Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada.6 p.

Bibtex

@conference{7a93e53bd1af440fb9097b28aace1206,
title = "Test support strategies for MEMS",
abstract = "Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process.This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.",
author = "Andrew Richardson and Richard Rosing and Anthony Peyton and Anthony Dorey",
year = "1999",
month = jun,
day = "18",
language = "English",
pages = "345--350",
note = "5th IEEE International Mixed Signal Testing Workshop ; Conference date: 15-06-1999 Through 18-06-1999",

}

RIS

TY - CONF

T1 - Test support strategies for MEMS

AU - Richardson, Andrew

AU - Rosing, Richard

AU - Peyton, Anthony

AU - Dorey, Anthony

PY - 1999/6/18

Y1 - 1999/6/18

N2 - Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process.This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.

AB - Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process.This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.

M3 - Conference paper

SP - 345

EP - 350

T2 - 5th IEEE International Mixed Signal Testing Workshop

Y2 - 15 June 1999 through 18 June 1999

ER -