Accepted author manuscript, 143 KB, PDF document
Available under license: CC BY-NC-ND
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
}
TY - CONF
T1 - Test support strategies for MEMS
AU - Richardson, Andrew
AU - Rosing, Richard
AU - Peyton, Anthony
AU - Dorey, Anthony
PY - 1999/6/18
Y1 - 1999/6/18
N2 - Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process.This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.
AB - Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process.This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.
M3 - Conference paper
SP - 345
EP - 350
T2 - 5th IEEE International Mixed Signal Testing Workshop
Y2 - 15 June 1999 through 18 June 1999
ER -