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Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. / Burbidge, M.; Richardson, Andrew M. D.; Lechner, A.
Proceedings of the 7th IEEE international test workshop. 2001. p. 97-102.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Burbidge, M, Richardson, AMD & Lechner, A 2001, Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. in Proceedings of the 7th IEEE international test workshop. pp. 97-102.

APA

Burbidge, M., Richardson, A. M. D., & Lechner, A. (2001). Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In Proceedings of the 7th IEEE international test workshop (pp. 97-102)

Vancouver

Burbidge M, Richardson AMD, Lechner A. Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In Proceedings of the 7th IEEE international test workshop. 2001. p. 97-102

Author

Burbidge, M. ; Richardson, Andrew M. D. ; Lechner, A. / Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. Proceedings of the 7th IEEE international test workshop. 2001. pp. 97-102

Bibtex

@inbook{b60339cea8804ec0bdba4ae74a451d5d,
title = "Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.",
author = "M. Burbidge and Richardson, {Andrew M. D.} and A. Lechner",
year = "2001",
language = "English",
pages = "97--102",
booktitle = "Proceedings of the 7th IEEE international test workshop",

}

RIS

TY - CHAP

T1 - Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

AU - Burbidge, M.

AU - Richardson, Andrew M. D.

AU - Lechner, A.

PY - 2001

Y1 - 2001

M3 - Chapter

SP - 97

EP - 102

BT - Proceedings of the 7th IEEE international test workshop

ER -