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Testing high resolution SD ADC’s by using the noise transfer function

Research output: Contribution to conferenceConference paper

Published

Associated organisational unit

Publication date26/05/2004
Number of pages0
Original languageEnglish

Conference

Conference9th IEEE European Test Symposium
CountryFrance
CityCorsica
Period23/05/0426/05/04

Abstract

A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysis
demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.