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Testing high resolution SD ADC’s by using the noise transfer function

Research output: Contribution to conferenceConference paper

Publication date26/05/2004
Number of pages0
<mark>Original language</mark>English


Conference9th IEEE European Test Symposium


A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysis
demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.