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Testing high resolution SD ADC’s by using the noise transfer function

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

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Testing high resolution SD ADC’s by using the noise transfer function. / Richardson, Andrew; De-Venuto, Daniela.
2004. Paper presented at 9th IEEE European Test Symposium, Corsica, France.

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

Harvard

Richardson, A & De-Venuto, D 2004, 'Testing high resolution SD ADC’s by using the noise transfer function', Paper presented at 9th IEEE European Test Symposium, Corsica, France, 23/05/04 - 26/05/04. <http://www2.lirmm.fr/~w3mic/ETW/ETS04/>

APA

Richardson, A., & De-Venuto, D. (2004). Testing high resolution SD ADC’s by using the noise transfer function. Paper presented at 9th IEEE European Test Symposium, Corsica, France. http://www2.lirmm.fr/~w3mic/ETW/ETS04/

Vancouver

Richardson A, De-Venuto D. Testing high resolution SD ADC’s by using the noise transfer function. 2004. Paper presented at 9th IEEE European Test Symposium, Corsica, France.

Author

Richardson, Andrew ; De-Venuto, Daniela. / Testing high resolution SD ADC’s by using the noise transfer function. Paper presented at 9th IEEE European Test Symposium, Corsica, France.

Bibtex

@conference{324f961edad1488bbd0d5761dc7e80ca,
title = "Testing high resolution SD ADC{\textquoteright}s by using the noise transfer function",
abstract = "A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC{\textquoteright}s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysisdemonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.",
keywords = "ADC test, Mixed Signal Test, Sigma Delta Test, Design for Testability",
author = "Andrew Richardson and Daniela De-Venuto",
year = "2004",
month = may,
day = "26",
language = "English",
note = "9th IEEE European Test Symposium ; Conference date: 23-05-2004 Through 26-05-2004",

}

RIS

TY - CONF

T1 - Testing high resolution SD ADC’s by using the noise transfer function

AU - Richardson, Andrew

AU - De-Venuto, Daniela

PY - 2004/5/26

Y1 - 2004/5/26

N2 - A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysisdemonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.

AB - A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysisdemonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.

KW - ADC test

KW - Mixed Signal Test

KW - Sigma Delta Test

KW - Design for Testability

M3 - Conference paper

T2 - 9th IEEE European Test Symposium

Y2 - 23 May 2004 through 26 May 2004

ER -