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The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

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The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality. / Richardson, Andrew; Nicholson, Richard.
1999. 257-261 Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada.

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

Harvard

Richardson, A & Nicholson, R 1999, 'The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality', Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada, 15/06/99 - 18/06/99 pp. 257-261.

APA

Richardson, A., & Nicholson, R. (1999). The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality. 257-261. Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada.

Vancouver

Richardson A, Nicholson R. The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality. 1999. Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada.

Author

Richardson, Andrew ; Nicholson, Richard. / The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality. Paper presented at 5th IEEE International Mixed Signal Testing Workshop, Whistler, Canada.5 p.

Bibtex

@conference{71cd963a75dc47e0aebc3edafc2181ae,
title = "The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality",
abstract = "The neuMOS transistor is a comparatively new device developed in 1991 at Tohoku University, Japan, which is currently showing great promise in the direction of enhanced circuit functionality, particularly in Neural Network applications. In this paper we examine the possibilities of applying the inherent enhanced functionality of the neuMOS transistor to analogue and digital BIST. A novel concept is introduced which can extend existing sw-opamp structures. Finally, potential outgoing quality enhancement in VLSI neuMOS circuits over the CMOS equivalents are considered.",
author = "Andrew Richardson and Richard Nicholson",
year = "1999",
month = jun,
day = "18",
language = "English",
pages = "257--261",
note = "5th IEEE International Mixed Signal Testing Workshop ; Conference date: 15-06-1999 Through 18-06-1999",

}

RIS

TY - CONF

T1 - The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

AU - Richardson, Andrew

AU - Nicholson, Richard

PY - 1999/6/18

Y1 - 1999/6/18

N2 - The neuMOS transistor is a comparatively new device developed in 1991 at Tohoku University, Japan, which is currently showing great promise in the direction of enhanced circuit functionality, particularly in Neural Network applications. In this paper we examine the possibilities of applying the inherent enhanced functionality of the neuMOS transistor to analogue and digital BIST. A novel concept is introduced which can extend existing sw-opamp structures. Finally, potential outgoing quality enhancement in VLSI neuMOS circuits over the CMOS equivalents are considered.

AB - The neuMOS transistor is a comparatively new device developed in 1991 at Tohoku University, Japan, which is currently showing great promise in the direction of enhanced circuit functionality, particularly in Neural Network applications. In this paper we examine the possibilities of applying the inherent enhanced functionality of the neuMOS transistor to analogue and digital BIST. A novel concept is introduced which can extend existing sw-opamp structures. Finally, potential outgoing quality enhancement in VLSI neuMOS circuits over the CMOS equivalents are considered.

M3 - Conference paper

SP - 257

EP - 261

T2 - 5th IEEE International Mixed Signal Testing Workshop

Y2 - 15 June 1999 through 18 June 1999

ER -