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The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit.

Research output: Contribution to Journal/MagazineJournal article

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The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit. / Jeffery, Carl; Cutajar, Rueben; Richardson, Andrew M. D. et al.
In: Journal of Electronic Testing, Vol. 21, No. 4, 08.2005, p. 405-416.

Research output: Contribution to Journal/MagazineJournal article

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APA

Vancouver

Jeffery C, Cutajar R, Richardson AMD, Prosser S, Lickess M, Riches S. The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit. Journal of Electronic Testing. 2005 Aug;21(4):405-416. doi: 10.1007/s10836-005-1272-3

Author

Jeffery, Carl ; Cutajar, Rueben ; Richardson, Andrew M. D. et al. / The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit. In: Journal of Electronic Testing. 2005 ; Vol. 21, No. 4. pp. 405-416.

Bibtex

@article{699edcfebd9e4071976ac815d28aaf55,
title = "The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit.",
abstract = "This paper presents an innovative application of IEEE1149.4 and the Integrated Diagnostic Reconfiguration (IDR) method to an Automotive Electronic Control Unit implemented as a fully-integrated mixed-signal system. The IEEE1149.4 test structure has been embedded and used on-line for interconnect monitoring and signal analysis. This provides higher resolution failure diagnostics enabling localised fault compensation. A novel On-Line Monitoring architecture is presented, that supports real-time testing of the critical circuit nodes. The paper concludes that fault tolerance can be integrated into mixed-signal electronic systems to handle key failure modes.",
keywords = "IEEE1149.4 - on-line monitoring - fault tolerance - boundary scan - IDR",
author = "Carl Jeffery and Rueben Cutajar and Richardson, {Andrew M. D.} and Steve Prosser and M. Lickess and Steve Riches",
year = "2005",
month = aug,
doi = "10.1007/s10836-005-1272-3",
language = "English",
volume = "21",
pages = "405--416",
journal = "Journal of Electronic Testing",
issn = "0923-8174",
publisher = "Springer Netherlands",
number = "4",

}

RIS

TY - JOUR

T1 - The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit.

AU - Jeffery, Carl

AU - Cutajar, Rueben

AU - Richardson, Andrew M. D.

AU - Prosser, Steve

AU - Lickess, M.

AU - Riches, Steve

PY - 2005/8

Y1 - 2005/8

N2 - This paper presents an innovative application of IEEE1149.4 and the Integrated Diagnostic Reconfiguration (IDR) method to an Automotive Electronic Control Unit implemented as a fully-integrated mixed-signal system. The IEEE1149.4 test structure has been embedded and used on-line for interconnect monitoring and signal analysis. This provides higher resolution failure diagnostics enabling localised fault compensation. A novel On-Line Monitoring architecture is presented, that supports real-time testing of the critical circuit nodes. The paper concludes that fault tolerance can be integrated into mixed-signal electronic systems to handle key failure modes.

AB - This paper presents an innovative application of IEEE1149.4 and the Integrated Diagnostic Reconfiguration (IDR) method to an Automotive Electronic Control Unit implemented as a fully-integrated mixed-signal system. The IEEE1149.4 test structure has been embedded and used on-line for interconnect monitoring and signal analysis. This provides higher resolution failure diagnostics enabling localised fault compensation. A novel On-Line Monitoring architecture is presented, that supports real-time testing of the critical circuit nodes. The paper concludes that fault tolerance can be integrated into mixed-signal electronic systems to handle key failure modes.

KW - IEEE1149.4 - on-line monitoring - fault tolerance - boundary scan - IDR

U2 - 10.1007/s10836-005-1272-3

DO - 10.1007/s10836-005-1272-3

M3 - Journal article

VL - 21

SP - 405

EP - 416

JO - Journal of Electronic Testing

JF - Journal of Electronic Testing

SN - 0923-8174

IS - 4

ER -