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  • LinGrapheneConductivity_v6

    Rights statement: Copyright 2020 American Institute of Physics. The following article appeared in Applied Physics Letters, 116, (2), 2020 and may be found at http://dx.doi.org/10.1063/1.5135644 This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping

Research output: Contribution to journalJournal article

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  • Hungyen Lin
  • Oliver Burton
  • Sebastian Engelbrecht
  • Kai-Henning Tybussek
  • Bernd M. Fischer
  • Stephan Hofmann
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Article number021105
<mark>Journal publication date</mark>13/01/2020
<mark>Journal</mark>Applied Physics Letters
Issue number2
Volume116
Number of pages5
Publication StatusPublished
<mark>Original language</mark>English

Abstract

We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapor deposited graphene films through silicon support. We validate the technique against measurements performed using the established transmission based THz-TDS. Our through-substrate approach allows unhindered access to the graphene top surface and thus, as we discuss, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells.

Bibliographic note

Copyright 2020 American Institute of Physics. The following article appeared in Applied Physics Letters, 116, (2), 2020 and may be found at http://dx.doi.org/10.1063/1.5135644 This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.