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Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes. / Stone, R; Rosamond, Mark C.; Coleman, K et al.
In: Review of Scientific Instruments, Vol. 84, No. 3, 035107, 28.03.2013.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Stone, R, Rosamond, MC, Coleman, K, Petty, MC, Kolosov, O, Bowen, L & Zeze, DA 2013, 'Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes', Review of Scientific Instruments, vol. 84, no. 3, 035107. https://doi.org/10.1063/1.4797483

APA

Stone, R., Rosamond, M. C., Coleman, K., Petty, M. C., Kolosov, O., Bowen, L., & Zeze, D. A. (2013). Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes. Review of Scientific Instruments, 84(3), Article 035107. https://doi.org/10.1063/1.4797483

Vancouver

Stone R, Rosamond MC, Coleman K, Petty MC, Kolosov O, Bowen L et al. Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes. Review of Scientific Instruments. 2013 Mar 28;84(3):035107. doi: 10.1063/1.4797483

Author

Stone, R ; Rosamond, Mark C. ; Coleman, K et al. / Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes. In: Review of Scientific Instruments. 2013 ; Vol. 84, No. 3.

Bibtex

@article{1bbea3f40b5c4129b0f80989ad906fae,
title = "Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes",
abstract = "The benefits of a new electrochemical etching method for the controlled sharpening of sub-micron tungsten probes are demonstrated. The proposed technique only utilizes the insulating effect of the WO42− by-product which offers more practical ways of controlling the process parameters. The electrosharpening method was fully automated through the analysis of the process current, bulk coulometry, shadowgraphs, and time lapse microscopy. Tip radii smaller than 15 nm were maintained over a wide range of controlled lengths up to 4.5 mm with conic angles of less than 1°.",
keywords = "electrochemical analysis , etching , tungsten",
author = "R Stone and Rosamond, {Mark C.} and K Coleman and Petty, {Michael C.} and Oleg Kolosov and L Bowen and Zeze, {Dagou A.}",
year = "2013",
month = mar,
day = "28",
doi = "10.1063/1.4797483",
language = "English",
volume = "84",
journal = "Review of Scientific Instruments",
issn = "1089-7623",
publisher = "American Institute of Physics Inc.",
number = "3",

}

RIS

TY - JOUR

T1 - Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes

AU - Stone, R

AU - Rosamond, Mark C.

AU - Coleman, K

AU - Petty, Michael C.

AU - Kolosov, Oleg

AU - Bowen, L

AU - Zeze, Dagou A.

PY - 2013/3/28

Y1 - 2013/3/28

N2 - The benefits of a new electrochemical etching method for the controlled sharpening of sub-micron tungsten probes are demonstrated. The proposed technique only utilizes the insulating effect of the WO42− by-product which offers more practical ways of controlling the process parameters. The electrosharpening method was fully automated through the analysis of the process current, bulk coulometry, shadowgraphs, and time lapse microscopy. Tip radii smaller than 15 nm were maintained over a wide range of controlled lengths up to 4.5 mm with conic angles of less than 1°.

AB - The benefits of a new electrochemical etching method for the controlled sharpening of sub-micron tungsten probes are demonstrated. The proposed technique only utilizes the insulating effect of the WO42− by-product which offers more practical ways of controlling the process parameters. The electrosharpening method was fully automated through the analysis of the process current, bulk coulometry, shadowgraphs, and time lapse microscopy. Tip radii smaller than 15 nm were maintained over a wide range of controlled lengths up to 4.5 mm with conic angles of less than 1°.

KW - electrochemical analysis

KW - etching

KW - tungsten

U2 - 10.1063/1.4797483

DO - 10.1063/1.4797483

M3 - Journal article

VL - 84

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 1089-7623

IS - 3

M1 - 035107

ER -