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Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains

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Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains. / Dinelli, Franco; Albonetti, Cristiano; Kolosov, Oleg V.
In: Ultramicroscopy, Vol. 111, No. 4, 03.2011, p. 267-272.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Dinelli, F, Albonetti, C & Kolosov, OV 2011, 'Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains', Ultramicroscopy, vol. 111, no. 4, pp. 267-272. https://doi.org/10.1016/j.ultramic.2010.12.019

APA

Dinelli, F., Albonetti, C., & Kolosov, O. V. (2011). Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains. Ultramicroscopy, 111(4), 267-272. https://doi.org/10.1016/j.ultramic.2010.12.019

Vancouver

Dinelli F, Albonetti C, Kolosov OV. Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains. Ultramicroscopy. 2011 Mar;111(4):267-272. doi: 10.1016/j.ultramic.2010.12.019

Author

Dinelli, Franco ; Albonetti, Cristiano ; Kolosov, Oleg V. / Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains. In: Ultramicroscopy. 2011 ; Vol. 111, No. 4. pp. 267-272.

Bibtex

@article{407ed7bdba3346fe8c9ac9ef1f9b7ca2,
title = "Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains",
abstract = "The analysis of the formation of ultra-thin organic films is a very important issue. In fact, it is known that the properties of organic light emitting diodes and field effect transistors are strongly affected by the early growth stages. For instance, in the case of sexithiophene, the presence of domains made of molecules with the backbone parallel to the substrate surface has been indirectly evidenced by photoluminescence spectroscopy and confocal microscopy. On the contrary, conventional scanning force microscopy both in contact and intermittent contact modes have failed to detect such domains. In this paper, we show that Ultrasonic Force Microscopy (UFM), sensitive to nanomechanical properties, allows one to directly identify the structure of sub-monolayer thick films. Sexithiophene flat domains have been imaged for the first time with nanometer scale spatial resolution. A comparison with lateral force and intermittent contact modes has been carried out in order to explain the origins of the UFM contrast and its advantages. In particular, it indicates that UFM is highly suitable for investigations where high sensitivity to material properties, low specimen damage and high spatial resolution are required. (C) 2010 Elsevier B.V. All rights reserved.",
keywords = "Scanning probe microscopy; Ultrasonic force microscopy, Ultrasonic force microscopy, Organic conjugated molecules, Sexithiophene , Ultra-thin films , Organic film growth",
author = "Franco Dinelli and Cristiano Albonetti and Kolosov, {Oleg V.}",
year = "2011",
month = mar,
doi = "10.1016/j.ultramic.2010.12.019",
language = "English",
volume = "111",
pages = "267--272",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier Science B.V.",
number = "4",

}

RIS

TY - JOUR

T1 - Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains

AU - Dinelli, Franco

AU - Albonetti, Cristiano

AU - Kolosov, Oleg V.

PY - 2011/3

Y1 - 2011/3

N2 - The analysis of the formation of ultra-thin organic films is a very important issue. In fact, it is known that the properties of organic light emitting diodes and field effect transistors are strongly affected by the early growth stages. For instance, in the case of sexithiophene, the presence of domains made of molecules with the backbone parallel to the substrate surface has been indirectly evidenced by photoluminescence spectroscopy and confocal microscopy. On the contrary, conventional scanning force microscopy both in contact and intermittent contact modes have failed to detect such domains. In this paper, we show that Ultrasonic Force Microscopy (UFM), sensitive to nanomechanical properties, allows one to directly identify the structure of sub-monolayer thick films. Sexithiophene flat domains have been imaged for the first time with nanometer scale spatial resolution. A comparison with lateral force and intermittent contact modes has been carried out in order to explain the origins of the UFM contrast and its advantages. In particular, it indicates that UFM is highly suitable for investigations where high sensitivity to material properties, low specimen damage and high spatial resolution are required. (C) 2010 Elsevier B.V. All rights reserved.

AB - The analysis of the formation of ultra-thin organic films is a very important issue. In fact, it is known that the properties of organic light emitting diodes and field effect transistors are strongly affected by the early growth stages. For instance, in the case of sexithiophene, the presence of domains made of molecules with the backbone parallel to the substrate surface has been indirectly evidenced by photoluminescence spectroscopy and confocal microscopy. On the contrary, conventional scanning force microscopy both in contact and intermittent contact modes have failed to detect such domains. In this paper, we show that Ultrasonic Force Microscopy (UFM), sensitive to nanomechanical properties, allows one to directly identify the structure of sub-monolayer thick films. Sexithiophene flat domains have been imaged for the first time with nanometer scale spatial resolution. A comparison with lateral force and intermittent contact modes has been carried out in order to explain the origins of the UFM contrast and its advantages. In particular, it indicates that UFM is highly suitable for investigations where high sensitivity to material properties, low specimen damage and high spatial resolution are required. (C) 2010 Elsevier B.V. All rights reserved.

KW - Scanning probe microscopy; Ultrasonic force microscopy

KW - Ultrasonic force microscopy

KW - Organic conjugated molecules

KW - Sexithiophene

KW - Ultra-thin films

KW - Organic film growth

UR - http://www.scopus.com/inward/record.url?scp=78651359826&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2010.12.019

DO - 10.1016/j.ultramic.2010.12.019

M3 - Journal article

VL - 111

SP - 267

EP - 272

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 4

ER -