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Ultrasonic force microscopy in waveguide mode up to 100 MHz

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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Ultrasonic force microscopy in waveguide mode up to 100 MHz. / Inagaki, K.; Kolosov, Oleg; Briggs, G. Andrew D. et al.
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE. ed. / S. C. Schneider; M. Levy; B. R. McAvoy. Vol. 2 New York: IEEE, 1998. p. 1255-1259.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Inagaki, K, Kolosov, O, Briggs, GAD, Muto, S, Horisaki, Y & Wright, OB 1998, Ultrasonic force microscopy in waveguide mode up to 100 MHz. in SC Schneider, M Levy & BR McAvoy (eds), Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE. vol. 2, IEEE, New York, pp. 1255-1259, 1998 IEEE Ultrasonics Symposium, SENDAI, 5/10/98. https://doi.org/10.1109/ULTSYM.1998.765067

APA

Inagaki, K., Kolosov, O., Briggs, G. A. D., Muto, S., Horisaki, Y., & Wright, O. B. (1998). Ultrasonic force microscopy in waveguide mode up to 100 MHz. In S. C. Schneider, M. Levy, & B. R. McAvoy (Eds.), Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE (Vol. 2, pp. 1255-1259). IEEE. https://doi.org/10.1109/ULTSYM.1998.765067

Vancouver

Inagaki K, Kolosov O, Briggs GAD, Muto S, Horisaki Y, Wright OB. Ultrasonic force microscopy in waveguide mode up to 100 MHz. In Schneider SC, Levy M, McAvoy BR, editors, Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE. Vol. 2. New York: IEEE. 1998. p. 1255-1259 doi: 10.1109/ULTSYM.1998.765067

Author

Inagaki, K. ; Kolosov, Oleg ; Briggs, G. Andrew D. et al. / Ultrasonic force microscopy in waveguide mode up to 100 MHz. Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE. editor / S. C. Schneider ; M. Levy ; B. R. McAvoy. Vol. 2 New York : IEEE, 1998. pp. 1255-1259

Bibtex

@inproceedings{c6482baa1cb049a48c4e7e5857822487,
title = "Ultrasonic force microscopy in waveguide mode up to 100 MHz",
abstract = "We present experimental results that extend the frequency range of ultrasonic force microscopy (UFM) to 100 MHz, operating in a mode in which the cantilever base is vibrated. In this {"}waveguide-UFM{"} mode flexural ultrasonic vibrations are launched down the cantilever as in a waveguide, without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected using an optical lever at the modulation frequency in an conventional atomic force microscope. Experiments were performed on a sample of InAs self-assembled quantum dots on a GaAs substrate. The dots, of order 10-100 nm in diameter, were clearly resolved up to operating frequencies similar to 100 MHZ, demonstrating the difference in elastic properties. Images were also obtained for a polycrystalline chromium film structure deposited on a silicon substrate.",
author = "K. Inagaki and Oleg Kolosov and Briggs, {G. Andrew D.} and S. Muto and Y. Horisaki and Wright, {O. B.}",
year = "1998",
doi = "10.1109/ULTSYM.1998.765067",
language = "English",
isbn = "0-7803-4096-5",
volume = "2",
pages = "1255--1259",
editor = "Schneider, {S. C.} and M. Levy and McAvoy, {B. R.}",
booktitle = "Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE",
publisher = "IEEE",
note = "1998 IEEE Ultrasonics Symposium ; Conference date: 05-10-1998 Through 08-10-1998",

}

RIS

TY - GEN

T1 - Ultrasonic force microscopy in waveguide mode up to 100 MHz

AU - Inagaki, K.

AU - Kolosov, Oleg

AU - Briggs, G. Andrew D.

AU - Muto, S.

AU - Horisaki, Y.

AU - Wright, O. B.

PY - 1998

Y1 - 1998

N2 - We present experimental results that extend the frequency range of ultrasonic force microscopy (UFM) to 100 MHz, operating in a mode in which the cantilever base is vibrated. In this "waveguide-UFM" mode flexural ultrasonic vibrations are launched down the cantilever as in a waveguide, without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected using an optical lever at the modulation frequency in an conventional atomic force microscope. Experiments were performed on a sample of InAs self-assembled quantum dots on a GaAs substrate. The dots, of order 10-100 nm in diameter, were clearly resolved up to operating frequencies similar to 100 MHZ, demonstrating the difference in elastic properties. Images were also obtained for a polycrystalline chromium film structure deposited on a silicon substrate.

AB - We present experimental results that extend the frequency range of ultrasonic force microscopy (UFM) to 100 MHz, operating in a mode in which the cantilever base is vibrated. In this "waveguide-UFM" mode flexural ultrasonic vibrations are launched down the cantilever as in a waveguide, without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected using an optical lever at the modulation frequency in an conventional atomic force microscope. Experiments were performed on a sample of InAs self-assembled quantum dots on a GaAs substrate. The dots, of order 10-100 nm in diameter, were clearly resolved up to operating frequencies similar to 100 MHZ, demonstrating the difference in elastic properties. Images were also obtained for a polycrystalline chromium film structure deposited on a silicon substrate.

U2 - 10.1109/ULTSYM.1998.765067

DO - 10.1109/ULTSYM.1998.765067

M3 - Conference contribution/Paper

SN - 0-7803-4096-5

VL - 2

SP - 1255

EP - 1259

BT - Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE

A2 - Schneider, S. C.

A2 - Levy, M.

A2 - McAvoy, B. R.

PB - IEEE

CY - New York

T2 - 1998 IEEE Ultrasonics Symposium

Y2 - 5 October 1998 through 8 October 1998

ER -