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Using bias superposition to test a thick film conductance sensor.

Research output: Contribution to Journal/MagazineJournal article

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Standard

Using bias superposition to test a thick film conductance sensor. / Jeffery, Carl; Zhou, Xu; Richardson, Andrew M. D.
In: Journal of Physics: Conference Series, Vol. 15, 2005, p. 161-166.

Research output: Contribution to Journal/MagazineJournal article

Harvard

Jeffery, C, Zhou, X & Richardson, AMD 2005, 'Using bias superposition to test a thick film conductance sensor.', Journal of Physics: Conference Series, vol. 15, pp. 161-166. https://doi.org/10.1088/1742-6596/15/1/027

APA

Vancouver

Jeffery C, Zhou X, Richardson AMD. Using bias superposition to test a thick film conductance sensor. Journal of Physics: Conference Series. 2005;15:161-166. doi: 10.1088/1742-6596/15/1/027

Author

Jeffery, Carl ; Zhou, Xu ; Richardson, Andrew M. D. / Using bias superposition to test a thick film conductance sensor. In: Journal of Physics: Conference Series. 2005 ; Vol. 15. pp. 161-166.

Bibtex

@article{95bf88e103424c808523499e9c8ca1d9,
title = "Using bias superposition to test a thick film conductance sensor.",
abstract = "A novel on-line monitoring technique for a range of MEMS and integrated sensor systems is presented based on the injection of a test stimuli into the bias structure of transducer functions. The technique `Bias Superposition' utilises both signal injection and signal extraction techniques to achieve an indication of structural integrity of the transducer and interface. The technique has been successfully applied to a thick film conductance sensor.",
author = "Carl Jeffery and Xu Zhou and Richardson, {Andrew M. D.}",
note = "Proceedings of the Sensors and their Applications XIII Conference.",
year = "2005",
doi = "10.1088/1742-6596/15/1/027",
language = "English",
volume = "15",
pages = "161--166",
journal = "Journal of Physics: Conference Series",
issn = "1742-6596",
publisher = "IOP Publishing Ltd.",

}

RIS

TY - JOUR

T1 - Using bias superposition to test a thick film conductance sensor.

AU - Jeffery, Carl

AU - Zhou, Xu

AU - Richardson, Andrew M. D.

N1 - Proceedings of the Sensors and their Applications XIII Conference.

PY - 2005

Y1 - 2005

N2 - A novel on-line monitoring technique for a range of MEMS and integrated sensor systems is presented based on the injection of a test stimuli into the bias structure of transducer functions. The technique `Bias Superposition' utilises both signal injection and signal extraction techniques to achieve an indication of structural integrity of the transducer and interface. The technique has been successfully applied to a thick film conductance sensor.

AB - A novel on-line monitoring technique for a range of MEMS and integrated sensor systems is presented based on the injection of a test stimuli into the bias structure of transducer functions. The technique `Bias Superposition' utilises both signal injection and signal extraction techniques to achieve an indication of structural integrity of the transducer and interface. The technique has been successfully applied to a thick film conductance sensor.

U2 - 10.1088/1742-6596/15/1/027

DO - 10.1088/1742-6596/15/1/027

M3 - Journal article

VL - 15

SP - 161

EP - 166

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6596

ER -