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Results for SIMS
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A detailed comparison of measured and simulated optical properties of a short-period GaAs/Al
x
Ga
1-
x
As distributed Bragg reflector
Wilson, T.
,
Hodgson, P.
,
Robson, A.
, Jackson, C., Grew, B. &
Hayne, M.
,
25/03/2020
,
In:
Semiconductor Science and Technology.
35
,
5
,
6 p.
, 055003.
Research output
:
Contribution to Journal/Magazine
›
Journal article
›
peer-review